METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

RIBOTTA, LUIGI
 Distribuzione geografica
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Continente #
NA - Nord America 1.087
EU - Europa 1.031
AS - Asia 868
SA - Sud America 76
AF - Africa 11
OC - Oceania 5
Continente sconosciuto - Info sul continente non disponibili 1
Totale 3.079
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Nazione #
US - Stati Uniti d'America 1.051
IT - Italia 454
SG - Singapore 411
DE - Germania 174
CN - Cina 163
HK - Hong Kong 112
FR - Francia 86
KR - Corea 84
BR - Brasile 60
GB - Regno Unito 56
SE - Svezia 55
UA - Ucraina 36
VN - Vietnam 33
FI - Finlandia 32
NL - Olanda 29
PL - Polonia 28
CA - Canada 18
CH - Svizzera 18
IE - Irlanda 16
JP - Giappone 13
MX - Messico 13
AT - Austria 11
BE - Belgio 10
TW - Taiwan 8
ES - Italia 6
IQ - Iraq 6
ZA - Sudafrica 6
EC - Ecuador 5
BD - Bangladesh 4
ID - Indonesia 4
IN - India 4
RO - Romania 4
RU - Federazione Russa 4
TR - Turchia 4
AR - Argentina 3
AU - Australia 3
PE - Perù 3
PH - Filippine 3
AZ - Azerbaigian 2
CZ - Repubblica Ceca 2
EE - Estonia 2
IL - Israele 2
MA - Marocco 2
NZ - Nuova Zelanda 2
PK - Pakistan 2
SA - Arabia Saudita 2
UZ - Uzbekistan 2
VE - Venezuela 2
AE - Emirati Arabi Uniti 1
AO - Angola 1
BG - Bulgaria 1
BS - Bahamas 1
CL - Cile 1
CO - Colombia 1
CR - Costa Rica 1
DK - Danimarca 1
GE - Georgia 1
GR - Grecia 1
HN - Honduras 1
JM - Giamaica 1
KE - Kenya 1
KG - Kirghizistan 1
KW - Kuwait 1
KZ - Kazakistan 1
LA - Repubblica Popolare Democratica del Laos 1
LT - Lituania 1
LV - Lettonia 1
MD - Moldavia 1
MT - Malta 1
MY - Malesia 1
NP - Nepal 1
OM - Oman 1
PA - Panama 1
PY - Paraguay 1
RS - Serbia 1
SN - Senegal 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 3.079
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Città #
Turin 196
Singapore 194
Hong Kong 100
Ashburn 87
Seoul 76
Boardman 75
Dallas 70
Beijing 63
Chandler 60
New York 56
Cambridge 51
Falkenstein 51
Munich 33
Fairfield 31
Strasbourg 30
Des Moines 29
Los Angeles 27
Helsinki 24
Rome 24
Nyköping 23
Ann Arbor 22
Milan 22
Frankfurt am Main 19
Wilmington 17
Woodbridge 17
Assago 16
Dublin 16
Genoa 15
Houston 15
Seattle 15
Amsterdam 14
Chicago 13
Warsaw 13
Guangzhou 12
West Jordan 12
Tokyo 11
Atlanta 10
Miami 10
Zurich 10
Brooklyn 9
Brussels 9
Council Bluffs 9
Ho Chi Minh City 9
Jacksonville 9
Ogden 9
San Mateo 9
Wroclaw 9
Boston 8
São Paulo 8
Dong Ket 7
Hanoi 7
Montreal 7
Braunschweig 6
Columbus 6
Krakow 6
Mexico City 6
Nuremberg 6
Phoenix 6
Roubaix 6
Bexley 5
Lappeenranta 5
Paris 5
Pisa 5
Toronto 5
Abbiategrasso 4
Florence 4
Johannesburg 4
Kwangju 4
Lucerne 4
Marcallo con Casone 4
Naples 4
Ottawa 4
San Francisco 4
Santa Clara 4
Schlieren 4
Shenzhen 4
Suwon 4
Suzhou 4
Taichung 4
Vienna 4
Enschede 3
Fossano 3
Honolulu 3
Innsbruck 3
Lima 3
London 3
Manchester 3
San Diego 3
Segrate 3
Stockholm 3
Taipei 3
The Dalles 3
Torino 3
Trento 3
Turku 3
Vigliano Biellese 3
Xi'an 3
Aguascalientes 2
Ankara 2
Baghdad 2
Totale 1.876
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Nome #
Morphology-driven parameters of engineered functional surfaces 235
A function-driven characterization of printed conductors on PV cells 194
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 183
3D characterization of printed structures by stylus- and optical-based measurements 182
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 158
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 113
Nanoporous Copper Films via Dynamic Hydrogen Bubbling: A Promising SERS Substrate for Sensitive Detection of Methylene Blue 106
Quantitative analysis and processing of surfaces and profiles from profilometry images 96
Characterization of surface finiture of different steels on mechanical components for energy harvesting 91
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 90
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy 90
Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for spring constant 88
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 87
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche 83
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 81
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images 79
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 74
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 73
AFM tip reconstruction with known tip characterisers in Python environment 73
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images 70
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters 70
3D reconstruction of AFM tip by using automatic shape recognition in Python environment 69
Atomic force microscopy metrology of non-spherical nanoparticles 68
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 66
Early Biological Response to Poly(ε-Caprolactone)/Alumina-Toughened Zirconia Composites Obtained by 3D Printing for Peri-Implant Application 65
GeoTOP project: geometric measurements 65
3D reconstruction of AFM tip by using known tip characterizers 62
Metrological characterization of nanoparticles by mAFM 59
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy 56
AFM metrology of shape controlled TiO2 nanoparticles 56
Quarantena 56
SurfILE: An Open-Source Python Package for Surface Topography Analysis 51
Surface slope measurement of steep silicon V-grooves using high NA Linnik interferometry 45
Preliminary characterisation of electrical and mechanical quantities on a MEMS-SPM device 44
Tip-sample interactions in the AFM study of rod-shaped nanostructures 43
Tip-sample interaction in the AFM characterization of bio-plant nanostructures 43
Characterization of aluminum nitride film properties for high signal-to-noise ratio piezoelectric micro-electromechanical system microphones 38
Design and development of the Moore three axis measuring machine control system 22
Totale 3.224
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Categoria #
all - tutte 25.965
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 25.965
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021168 0 0 0 5 58 15 24 5 16 27 9 9
2021/2022128 21 9 6 8 13 2 6 9 12 13 10 19
2022/2023274 35 14 13 22 16 25 49 20 28 5 28 19
2023/2024513 46 38 35 36 41 26 64 32 63 35 29 68
2024/20251.216 56 34 84 37 89 95 95 66 216 52 155 237
2025/2026771 223 227 300 21 0 0 0 0 0 0 0 0
Totale 3.224