METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

RIBOTTA, LUIGI
 Distribuzione geografica
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Continente #
NA - Nord America 670
EU - Europa 624
AS - Asia 274
OC - Oceania 3
SA - Sud America 2
Totale 1.573
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Nazione #
US - Stati Uniti d'America 658
IT - Italia 302
SG - Singapore 148
SE - Svezia 52
DE - Germania 51
CN - Cina 45
FR - Francia 45
HK - Hong Kong 41
GB - Regno Unito 39
UA - Ucraina 34
FI - Finlandia 24
IE - Irlanda 16
NL - Olanda 13
BE - Belgio 10
PL - Polonia 10
JP - Giappone 9
CA - Canada 8
KR - Corea 8
VN - Vietnam 7
AT - Austria 6
CH - Svizzera 5
ES - Italia 3
IN - India 3
MX - Messico 3
RO - Romania 3
TR - Turchia 3
CZ - Repubblica Ceca 2
IL - Israele 2
NZ - Nuova Zelanda 2
RU - Federazione Russa 2
AU - Australia 1
AZ - Azerbaigian 1
BG - Bulgaria 1
BR - Brasile 1
DK - Danimarca 1
EC - Ecuador 1
EE - Estonia 1
GE - Georgia 1
GR - Grecia 1
KG - Kirghizistan 1
KW - Kuwait 1
LA - Repubblica Popolare Democratica del Laos 1
LT - Lituania 1
LV - Lettonia 1
MD - Moldavia 1
PA - Panama 1
PK - Pakistan 1
SA - Arabia Saudita 1
UZ - Uzbekistan 1
Totale 1.573
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Città #
Turin 137
Singapore 129
Boardman 75
Chandler 60
Ashburn 59
Cambridge 51
New York 48
Hong Kong 37
Fairfield 31
Strasbourg 30
Rome 24
Nyköping 23
Ann Arbor 22
Helsinki 22
Los Angeles 19
Woodbridge 17
Dublin 16
Wilmington 16
Houston 15
Seattle 14
Milan 12
West Jordan 12
Genoa 11
Amsterdam 10
Brussels 9
Miami 9
Ogden 9
San Mateo 9
Jacksonville 8
Atlanta 7
Dong Ket 7
Tokyo 7
Warsaw 7
Braunschweig 6
Toronto 5
Abbiategrasso 4
Kwangju 4
Lucerne 4
Paris 4
Suwon 4
Fossano 3
Frankfurt am Main 3
Innsbruck 3
Krakow 3
London 3
Ottawa 3
San Diego 3
Shenzhen 3
Torino 3
Vienna 3
Vigliano Biellese 3
Besançon 2
Bonate Sopra 2
Boves 2
Candiolo 2
Falkenstein 2
Florence 2
Guangzhou 2
Haifa 2
Hanover 2
Ilmenau 2
Jiujiang 2
Lappeenranta 2
Melilla 2
Moscow 2
Nanjing 2
Naples 2
Piovera 2
Pisa 2
Redwood City 2
Rivoli 2
Saint-Chamond 2
San Mauro Torinese 2
San Pietro di Feletto 2
Santena 2
Shanghai 2
Taurano 2
Timișoara 2
Toyonaka 2
Trento 2
Xi'an 2
Zanica 2
Ankara 1
Athens 1
Baku 1
Beijing 1
Berlin 1
Bishkek 1
Brescia 1
Brno 1
Chicago 1
Chisinau 1
Chiswick 1
Clifton 1
Dammam 1
Dearborn 1
Dole 1
Dronero 1
Dunedin 1
Ealing 1
Totale 1.106
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Nome #
Morphology-driven parameters of engineered functional surfaces 197
A function-driven characterization of printed conductors on PV cells 152
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 147
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 130
3D characterization of printed structures by stylus- and optical-based measurements 124
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 70
Quantitative analysis and processing of surfaces and profiles from profilometry images 65
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 52
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 50
Software implementation for processing and quantitative analysis of surfaces and profiles from profilometry images 50
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche 49
Atomic force microscopy metrology of non-spherical nanoparticles 41
3D reconstruction of AFM tip by using automatic shape recognition in Python environment 40
Quarantena 40
Quantitative 3D determination of dimensional parameters of surfaces by optical profilometer’s images 39
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 34
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters 34
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy 33
AFM metrology of shape controlled TiO2 nanoparticles 33
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 33
AFM tip reconstruction with known tip characterisers in Python environment 33
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy 33
Metrological characterization of nanoparticles by mAFM 32
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 32
Characterization of surface finiture of different steels on mechanical components for energy harvesting 29
Tip-sample interactions in the AFM study of rod-shaped nanostructures 28
Tip-sample interaction in the AFM characterization of bio-plant nanostructures 26
3D reconstruction of AFM tip by using known tip characterizers 21
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 20
Early Biological Response to Poly(ε-Caprolactone)/Alumina-Toughened Zirconia Composites Obtained by 3D Printing for Peri-Implant Application 15
SurfILE: An Open-Source Python Package for Surface Topography Analysis 8
Totale 1.690
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Categoria #
all - tutte 15.724
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 15.724
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202014 0 0 0 0 0 0 2 0 3 5 4 0
2020/2021209 21 2 18 5 58 15 24 5 16 27 9 9
2021/2022128 21 9 6 8 13 2 6 9 12 13 10 19
2022/2023274 35 14 13 22 16 25 49 20 28 5 28 19
2023/2024513 46 38 35 36 41 26 64 32 63 35 29 68
2024/2025453 56 34 84 37 89 95 58 0 0 0 0 0
Totale 1.690