METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 7.682
EU - Europa 2.936
AS - Asia 798
SA - Sud America 33
Continente sconosciuto - Info sul continente non disponibili 17
OC - Oceania 10
AF - Africa 6
Totale 11.482
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Nazione #
US - Stati Uniti d'America 7.597
SE - Svezia 785
UA - Ucraina 534
GB - Regno Unito 424
IT - Italia 368
SG - Singapore 320
DE - Germania 299
CN - Cina 203
FR - Francia 195
HK - Hong Kong 108
CA - Canada 79
IE - Irlanda 70
FI - Finlandia 58
PL - Polonia 45
IN - India 37
BE - Belgio 36
JP - Giappone 34
RS - Serbia 34
RU - Federazione Russa 32
BR - Brasile 19
EU - Europa 16
KR - Corea 13
VN - Vietnam 12
TR - Turchia 11
TH - Thailandia 10
ES - Italia 9
RO - Romania 9
ID - Indonesia 7
AT - Austria 6
IL - Israele 6
NZ - Nuova Zelanda 6
SA - Arabia Saudita 6
AR - Argentina 5
CZ - Repubblica Ceca 5
MX - Messico 5
NL - Olanda 5
TW - Taiwan 5
AU - Australia 4
CO - Colombia 4
DK - Danimarca 4
AZ - Azerbaigian 3
IQ - Iraq 3
IR - Iran 3
LK - Sri Lanka 3
PH - Filippine 3
BA - Bosnia-Erzegovina 2
BD - Bangladesh 2
BG - Bulgaria 2
DZ - Algeria 2
GR - Grecia 2
HR - Croazia 2
LT - Lituania 2
MC - Monaco 2
NO - Norvegia 2
PE - Perù 2
PK - Pakistan 2
PT - Portogallo 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AM - Armenia 1
BN - Brunei Darussalam 1
CL - Cile 1
EC - Ecuador 1
EE - Estonia 1
GE - Georgia 1
KH - Cambogia 1
KW - Kuwait 1
MY - Malesia 1
OM - Oman 1
PA - Panama 1
SC - Seychelles 1
SK - Slovacchia (Repubblica Slovacca) 1
TN - Tunisia 1
VE - Venezuela 1
ZA - Sudafrica 1
ZW - Zimbabwe 1
Totale 11.482
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Città #
Cambridge 1.540
Fairfield 897
Woodbridge 647
Chandler 588
Ann Arbor 509
Wilmington 493
Houston 471
Ashburn 397
Seattle 381
Jacksonville 244
Singapore 216
Boardman 211
Nyköping 176
San Mateo 119
Hong Kong 98
Beijing 97
Dearborn 92
New York 72
Dublin 70
Toronto 69
Strasbourg 49
Torino 49
Kraków 35
Los Angeles 34
Turin 32
Brussels 30
Rome 27
Ogden 25
London 23
Tokyo 23
Las Vegas 21
San Diego 16
Redwood City 15
Guangzhou 14
Braunschweig 13
Hanover 13
Nanjing 13
Atlanta 12
Helsinki 11
Monmouth Junction 11
Caravino 8
Moscow 8
Redmond 8
West Jordan 8
Berlin 7
Dong Ket 7
Milan 7
Stoke-on-Trent 7
Carate 6
Chiswick 6
Haifa 6
Mechelen 6
Ottawa 6
São Paulo 6
Warsaw 6
Duncan 5
Falls Church 5
Riyadh 5
San Francisco 5
Shanghai 5
St Petersburg 5
Tappahannock 5
Cardiff 4
Hameln 4
Kwangju 4
Taipei 4
Amsterdam 3
Ankara 3
Bogotá 3
Central 3
Chengdu 3
Frankfurt am Main 3
Hanoi 3
Hounslow 3
Kilburn 3
Madrid 3
Munich 3
Nanchang 3
Prague 3
Prescot 3
Udine 3
Vigliano Biellese 3
Athens 2
Auckland 2
Baku 2
Bangalore 2
Bangkok 2
Besano 2
Bunkyo-ku 2
Centrale 2
Cinisello Balsamo 2
Clearwater 2
Colombo 2
Dresden 2
Federal 2
Fuzhou 2
Genoa 2
Herlev 2
Indiana 2
Islington 2
Totale 8.090
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Nome #
Dynamics modeling of CMM probing systems 362
Comparison of the performance of the next generation of optical interferometers 317
Recent advances of the metrological AFM at INRIM 246
Calibration of a ball bearing ring segment 246
Vickers Hardness Indentations measured with Atomic Force Microscopy 243
Traceable size determination of nanoparticles, a comparison among European metrology institutes 235
The Influence of Scanning Parameters on CMM Measurements 233
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 227
Design, manufacturing and calibration of a large ring segment 222
Coherence effects in Frequency-Modulated laser Spectroscopy 215
Comparison on Nanometrology: Nano 2—Step height 209
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 209
Strain measurements of cylinder magnetostrictive samples by interferometer readings 209
AFM analysis of MgB2 films and nanostructures 209
Structural and electrical characterisation of Mo films for transition-edge sensors 208
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 207
Two scanning tunneling microscope devices for large samples 202
Morphology-driven parameters of engineered functional surfaces 198
Calibration of surface roughness standards 196
A capacitive system for micro/nano positioning and attitude controls 194
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 189
Recent progresses in He-Ne lasers stabilized to 127I2 188
A sample scanning system with nanometric accuracy for quantitative SPM measurements 186
Fabrication of superconducting MgB2 nanostructures 183
Structural and surface properties of sputtered Nb films for multilayer devices 183
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 181
STM characterization of InP gratings for DFB laser fabrication 180
A metrological SPM for dimensional surface measurements 179
Helium-Neon lasers stabilized to iodine at 605 nm 179
The INRIM 1D comparator for diameter gauges and linear artefacts 177
A surface profile reconstruction method based on multisensor capacitive transducers 177
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 173
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 172
The IMGC calibration setup for microdisplacement actuators 172
Renewal of the gage-block interferometer at INRIM 172
A novel AC current source for capacitance-based displacement measurements 171
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 167
Nanometrology at the IMGC 165
Surface characterization of electroformed mirrors for an X-ray telescope 165
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 163
Surface texture measurements of gear tooth 163
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 163
International Intercomparison of Scanning Tunneling Microscopy 162
Large ring segment standard 161
STM carbon nanotube tips fabrication for critical dimension measurements 161
Surface characterization of sputtering niobium films by scanning tunneling microscopy 160
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 155
A function-driven characterization of printed conductors on PV cells 152
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 148
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 146
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 146
Interferometric calibration of microdisplacement actuators 144
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 133
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 130
3D characterization of printed structures by stylus- and optical-based measurements 124
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 123
Nanoscale metrology 118
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 118
Topography reconstruction by means of optical scatterometry 117
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 117
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 112
A precision Z-stage for Scanning Probe Microscopy 109
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 109
STM tips fabrication for critical dimension measurement 95
Intercomparison of scanning probe microscopes 95
Displacement measurements of piezoelectric actuators in the nanosize-range 86
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 50
Totale 11.606
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Categoria #
all - tutte 62.961
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 62.961
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020729 0 0 0 0 0 0 199 92 199 88 139 12
2020/20211.689 179 31 320 66 210 105 240 22 216 143 82 75
2021/20221.205 228 54 87 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/2025597 84 29 112 28 89 86 169 0 0 0 0 0
Totale 11.606