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PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 8.600
EU - Europa 3.239
AS - Asia 2.124
SA - Sud America 148
AF - Africa 26
Continente sconosciuto - Info sul continente non disponibili 18
OC - Oceania 10
Totale 14.165
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Nazione #
US - Stati Uniti d'America 8.457
SG - Singapore 948
SE - Svezia 799
UA - Ucraina 537
GB - Regno Unito 475
CN - Cina 448
IT - Italia 400
DE - Germania 380
HK - Hong Kong 288
FR - Francia 230
KR - Corea 150
BR - Brasile 116
CA - Canada 109
IE - Irlanda 72
PL - Polonia 70
IN - India 68
FI - Finlandia 63
JP - Giappone 53
VN - Vietnam 47
RU - Federazione Russa 43
BE - Belgio 36
RS - Serbia 35
MX - Messico 30
ES - Italia 21
TR - Turchia 21
EU - Europa 16
BD - Bangladesh 13
ID - Indonesia 13
ZA - Sudafrica 13
HR - Croazia 12
AR - Argentina 11
NL - Olanda 11
RO - Romania 10
TH - Thailandia 10
AT - Austria 9
IQ - Iraq 9
IL - Israele 7
LT - Lituania 7
PH - Filippine 7
SA - Arabia Saudita 7
AE - Emirati Arabi Uniti 6
NZ - Nuova Zelanda 6
CO - Colombia 5
CZ - Repubblica Ceca 5
TW - Taiwan 5
AU - Australia 4
DK - Danimarca 4
AZ - Azerbaigian 3
CL - Cile 3
DZ - Algeria 3
EC - Ecuador 3
IR - Iran 3
LK - Sri Lanka 3
PE - Perù 3
PK - Pakistan 3
VE - Venezuela 3
BA - Bosnia-Erzegovina 2
BG - Bulgaria 2
CH - Svizzera 2
GR - Grecia 2
MA - Marocco 2
MC - Monaco 2
MY - Malesia 2
NO - Norvegia 2
OM - Oman 2
PA - Panama 2
PT - Portogallo 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AL - Albania 1
AM - Armenia 1
BH - Bahrain 1
BN - Brunei Darussalam 1
BO - Bolivia 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EE - Estonia 1
EG - Egitto 1
GD - Grenada 1
GE - Georgia 1
GY - Guiana 1
KE - Kenya 1
KH - Cambogia 1
KW - Kuwait 1
MU - Mauritius 1
NP - Nepal 1
PS - Palestinian Territory 1
PY - Paraguay 1
SC - Seychelles 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
SN - Senegal 1
SR - Suriname 1
TN - Tunisia 1
XK - ???statistics.table.value.countryCode.XK??? 1
ZW - Zimbabwe 1
Totale 14.165
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Città #
Cambridge 1.540
Fairfield 897
Woodbridge 647
Chandler 588
Ashburn 516
Ann Arbor 510
Wilmington 493
Houston 479
Singapore 439
Seattle 385
Hong Kong 277
Jacksonville 246
Beijing 228
Boardman 211
Nyköping 176
Seoul 135
San Mateo 119
New York 107
Dearborn 92
Los Angeles 92
Toronto 72
Dublin 70
Strasbourg 49
Torino 49
Tokyo 41
Turin 40
Kraków 35
London 35
Des Moines 32
Atlanta 31
Brussels 30
Munich 29
Rome 28
Council Bluffs 26
Falkenstein 26
Denver 25
Ogden 25
Santa Clara 25
Warsaw 25
São Paulo 23
Dallas 22
Las Vegas 22
Brooklyn 21
Frankfurt am Main 19
Guangzhou 19
Ho Chi Minh City 19
San Diego 16
Chicago 15
Montreal 15
Redwood City 15
Chennai 14
Stockholm 14
The Dalles 14
Braunschweig 13
Hanover 13
Nanjing 13
Phoenix 13
Helsinki 12
Moscow 12
Manchester 11
Mexico City 11
Milan 11
Monmouth Junction 11
Mumbai 11
Ankara 10
Johannesburg 10
Poplar 10
San Francisco 10
Boston 9
Hanoi 9
Caravino 8
Columbus 8
Orem 8
Redmond 8
West Jordan 8
Zagreb 8
Berlin 7
Dong Ket 7
Stoke-on-Trent 7
Amsterdam 6
Carate 6
Chiswick 6
Haifa 6
Mechelen 6
Ottawa 6
Querétaro 6
St Petersburg 6
Bexley 5
Duncan 5
Falls Church 5
Milwaukee 5
Riyadh 5
Shanghai 5
Tappahannock 5
Cardiff 4
Hameln 4
Kwangju 4
Raleigh 4
Rio de Janeiro 4
Roubaix 4
Totale 9.483
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Nome #
Dynamics modeling of CMM probing systems 422
Surface texture measurements of gear tooth 368
Comparison of the performance of the next generation of optical interferometers 364
Calibration of a ball bearing ring segment 303
The Influence of Scanning Parameters on CMM Measurements 285
Design, manufacturing and calibration of a large ring segment 284
Recent advances of the metrological AFM at INRIM 282
AFM analysis of MgB2 films and nanostructures 267
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 265
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 263
Traceable size determination of nanoparticles, a comparison among European metrology institutes 263
Vickers Hardness Indentations measured with Atomic Force Microscopy 262
Coherence effects in Frequency-Modulated laser Spectroscopy 262
A capacitive system for micro/nano positioning and attitude controls 257
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 253
Morphology-driven parameters of engineered functional surfaces 252
Comparison on Nanometrology: Nano 2—Step height 250
Strain measurements of cylinder magnetostrictive samples by interferometer readings 249
Calibration of surface roughness standards 247
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 239
A sample scanning system with nanometric accuracy for quantitative SPM measurements 235
The INRIM 1D comparator for diameter gauges and linear artefacts 232
Structural and electrical characterisation of Mo films for transition-edge sensors 232
A metrological SPM for dimensional surface measurements 229
A surface profile reconstruction method based on multisensor capacitive transducers 224
Renewal of the gage-block interferometer at INRIM 224
Two scanning tunneling microscope devices for large samples 224
Large ring segment standard 222
A novel AC current source for capacitance-based displacement measurements 219
A function-driven characterization of printed conductors on PV cells 217
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 217
Fabrication of superconducting MgB2 nanostructures 209
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 209
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 209
Recent progresses in He-Ne lasers stabilized to 127I2 207
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 207
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 207
3D characterization of printed structures by stylus- and optical-based measurements 206
Structural and surface properties of sputtered Nb films for multilayer devices 200
STM characterization of InP gratings for DFB laser fabrication 200
Helium-Neon lasers stabilized to iodine at 605 nm 200
Nanometrology at the IMGC 195
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 194
The IMGC calibration setup for microdisplacement actuators 194
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 193
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 190
Surface characterization of electroformed mirrors for an X-ray telescope 189
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 186
International Intercomparison of Scanning Tunneling Microscopy 183
STM carbon nanotube tips fabrication for critical dimension measurements 180
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 179
Surface characterization of sputtering niobium films by scanning tunneling microscopy 178
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 169
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 164
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 164
Interferometric calibration of microdisplacement actuators 163
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 157
A precision Z-stage for Scanning Probe Microscopy 151
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 145
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 139
Nanoscale metrology 138
Topography reconstruction by means of optical scatterometry 138
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 130
STM tips fabrication for critical dimension measurement 116
Intercomparison of scanning probe microscopes 115
Displacement measurements of piezoelectric actuators in the nanosize-range 102
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 72
Totale 14.290
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Categoria #
all - tutte 81.334
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 81.334
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20211.093 0 0 0 0 210 105 240 22 216 143 82 75
2021/20221.205 228 54 87 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/20251.513 84 29 112 28 89 86 170 100 375 47 231 162
2025/20261.768 283 347 307 807 24 0 0 0 0 0 0 0
Totale 14.290