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PICOTTO, GIANBARTOLO
 Distribuzione geografica
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Continente #
NA - Nord America 8.150
EU - Europa 3.150
AS - Asia 1.473
SA - Sud America 79
Continente sconosciuto - Info sul continente non disponibili 17
AF - Africa 14
OC - Oceania 10
Totale 12.893
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Nazione #
US - Stati Uniti d'America 8.038
SE - Svezia 789
SG - Singapore 660
UA - Ucraina 536
GB - Regno Unito 444
IT - Italia 393
DE - Germania 379
CN - Cina 313
HK - Hong Kong 287
FR - Francia 230
CA - Canada 93
IE - Irlanda 72
FI - Finlandia 62
BR - Brasile 60
PL - Polonia 52
IN - India 51
RU - Federazione Russa 41
JP - Giappone 39
BE - Belgio 36
RS - Serbia 34
EU - Europa 16
KR - Corea 16
MX - Messico 16
TR - Turchia 15
VN - Vietnam 14
HR - Croazia 12
ES - Italia 11
NL - Olanda 10
RO - Romania 10
TH - Thailandia 10
AT - Austria 9
ID - Indonesia 8
BD - Bangladesh 7
IQ - Iraq 7
SA - Arabia Saudita 7
AR - Argentina 6
IL - Israele 6
NZ - Nuova Zelanda 6
CZ - Repubblica Ceca 5
PH - Filippine 5
TW - Taiwan 5
ZA - Sudafrica 5
AU - Australia 4
CO - Colombia 4
DK - Danimarca 4
AZ - Azerbaigian 3
IR - Iran 3
LK - Sri Lanka 3
LT - Lituania 3
PK - Pakistan 3
BA - Bosnia-Erzegovina 2
BG - Bulgaria 2
CH - Svizzera 2
CL - Cile 2
DZ - Algeria 2
EC - Ecuador 2
GR - Grecia 2
MC - Monaco 2
MY - Malesia 2
NO - Norvegia 2
OM - Oman 2
PA - Panama 2
PE - Perù 2
PT - Portogallo 2
VE - Venezuela 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AE - Emirati Arabi Uniti 1
AM - Armenia 1
BN - Brunei Darussalam 1
BO - Bolivia 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EE - Estonia 1
EG - Egitto 1
GE - Georgia 1
KE - Kenya 1
KH - Cambogia 1
KW - Kuwait 1
MA - Marocco 1
PS - Palestinian Territory 1
SC - Seychelles 1
SI - Slovenia 1
SK - Slovacchia (Repubblica Slovacca) 1
TN - Tunisia 1
ZW - Zimbabwe 1
Totale 12.893
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Città #
Cambridge 1.540
Fairfield 897
Woodbridge 647
Chandler 588
Ann Arbor 510
Wilmington 493
Houston 471
Ashburn 428
Seattle 382
Singapore 306
Hong Kong 276
Jacksonville 246
Boardman 211
Beijing 197
Nyköping 176
San Mateo 119
Dearborn 92
New York 75
Dublin 70
Toronto 69
Los Angeles 51
Strasbourg 49
Torino 49
Turin 40
Kraków 35
Des Moines 32
Brussels 30
Munich 29
Rome 28
London 27
Tokyo 27
Council Bluffs 26
Falkenstein 26
Ogden 25
Las Vegas 22
Frankfurt am Main 19
Atlanta 17
Guangzhou 16
San Diego 16
Santa Clara 16
Redwood City 15
The Dalles 14
Braunschweig 13
Hanover 13
Nanjing 13
Dallas 12
São Paulo 12
Helsinki 11
Monmouth Junction 11
Moscow 11
Brooklyn 10
Caravino 8
Columbus 8
Milan 8
Redmond 8
San Francisco 8
Warsaw 8
West Jordan 8
Zagreb 8
Berlin 7
Dong Ket 7
Mexico City 7
Phoenix 7
Stoke-on-Trent 7
Carate 6
Chennai 6
Chiswick 6
Haifa 6
Mechelen 6
Ottawa 6
St Petersburg 6
Amsterdam 5
Ankara 5
Bexley 5
Boston 5
Chicago 5
Duncan 5
Falls Church 5
Montreal 5
Riyadh 5
Shanghai 5
Stockholm 5
Tappahannock 5
Cardiff 4
Hameln 4
Kwangju 4
Roubaix 4
Taipei 4
Turku 4
Wroclaw 4
Bogotá 3
Bucheon-si 3
Central 3
Chengdu 3
Hanoi 3
Hounslow 3
Istanbul 3
Johannesburg 3
Kilburn 3
Madrid 3
Totale 8.767
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Nome #
Dynamics modeling of CMM probing systems 392
Surface texture measurements of gear tooth 344
Comparison of the performance of the next generation of optical interferometers 339
Calibration of a ball bearing ring segment 276
Recent advances of the metrological AFM at INRIM 269
The Influence of Scanning Parameters on CMM Measurements 260
Vickers Hardness Indentations measured with Atomic Force Microscopy 254
Design, manufacturing and calibration of a large ring segment 254
Traceable size determination of nanoparticles, a comparison among European metrology institutes 253
Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film 241
Coherence effects in Frequency-Modulated laser Spectroscopy 236
AFM analysis of MgB2 films and nanostructures 235
Strain measurements of cylinder magnetostrictive samples by interferometer readings 234
A multi-electrode plane capacitive sensor for displacement measurements and attitude controls 232
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 230
A capacitive system for micro/nano positioning and attitude controls 228
Morphology-driven parameters of engineered functional surfaces 227
Comparison on Nanometrology: Nano 2—Step height 226
Structural and electrical characterisation of Mo films for transition-edge sensors 222
Calibration of surface roughness standards 222
Two scanning tunneling microscope devices for large samples 211
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 210
A sample scanning system with nanometric accuracy for quantitative SPM measurements 208
The INRIM 1D comparator for diameter gauges and linear artefacts 207
EURAMET Project 866 "Interferometric Calibration of microdisplacement actuators" - Final Report 204
A metrological SPM for dimensional surface measurements 202
Recent progresses in He-Ne lasers stabilized to 127I2 197
A surface profile reconstruction method based on multisensor capacitive transducers 197
Renewal of the gage-block interferometer at INRIM 196
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing 196
Fabrication of superconducting MgB2 nanostructures 193
Large ring segment standard 193
A novel AC current source for capacitance-based displacement measurements 192
STM characterization of InP gratings for DFB laser fabrication 190
Structural and surface properties of sputtered Nb films for multilayer devices 189
Helium-Neon lasers stabilized to iodine at 605 nm 188
Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size 186
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements 185
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements 184
Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings 183
A function-driven characterization of printed conductors on PV cells 183
Comparison between the 127I2 stabilized He-Ne lasers at 633 nm and 612 nm of the BIPM and the IMGC 182
The IMGC calibration setup for microdisplacement actuators 182
Nanometrology at the IMGC 179
Surface characterization of electroformed mirrors for an X-ray telescope 177
Tip-sample characterization in the AFM study of a rod-shaped nanostructure 175
International Intercomparison of Scanning Tunneling Microscopy 173
STM carbon nanotube tips fabrication for critical dimension measurements 173
3D characterization of printed structures by stylus- and optical-based measurements 172
Surface characterization of sputtering niobium films by scanning tunneling microscopy 167
Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 159
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor 155
Comparison on step height measurements in the nano and micrometre range by scanning force microscopes 155
Interferometric calibration of microdisplacement actuators 152
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 151
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 137
Key comparison EURAMET.L-K8.2013 calibration of surface roughness standards 135
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 134
Nanoscale metrology 128
Topography reconstruction by means of optical scatterometry 128
A precision Z-stage for Scanning Probe Microscopy 127
Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB) 125
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE RID 119
STM tips fabrication for critical dimension measurement 106
Intercomparison of scanning probe microscopes 103
Displacement measurements of piezoelectric actuators in the nanosize-range 94
Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) 62
Totale 13.018
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Categoria #
all - tutte 75.981
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 75.981
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20211.510 0 31 320 66 210 105 240 22 216 143 82 75
2021/20221.205 228 54 87 80 125 65 112 90 123 117 49 75
2022/20231.470 87 91 104 166 159 296 7 149 239 36 72 64
2023/2024787 61 65 117 73 53 35 137 10 129 29 24 54
2024/20251.513 84 29 112 28 89 86 170 100 375 47 231 162
2025/2026496 283 213 0 0 0 0 0 0 0 0 0 0
Totale 13.018