statistiche ricercatore

CULTRERA, ALESSANDRO

Distribuzione geografica

Continente	#
NA - Nord America	2.497
EU - Europa	1.475
AS - Asia	726
SA - Sud America	15
AF - Africa	12
Continente sconosciuto - Info sul continente non disponibili	8
OC - Oceania	2
Totale	4.735

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Nazione	#
US - Stati Uniti d'America	2.457
IT - Italia	479
SE - Svezia	298
SG - Singapore	292
DE - Germania	208
CN - Cina	181
UA - Ucraina	136
HK - Hong Kong	135
GB - Regno Unito	114
FR - Francia	54
IE - Irlanda	38
CA - Canada	35
FI - Finlandia	33
NL - Olanda	30
BE - Belgio	24
PL - Polonia	22
RU - Federazione Russa	18
UZ - Uzbekistan	16
IN - India	14
ID - Indonesia	13
VN - Vietnam	13
IL - Israele	11
JP - Giappone	11
KR - Corea	8
BR - Brasile	7
EU - Europa	7
IR - Iran	7
ZA - Sudafrica	7
CH - Svizzera	6
CY - Cipro	6
TR - Turchia	6
AT - Austria	5
EC - Ecuador	4
BD - Bangladesh	3
MX - Messico	3
SA - Arabia Saudita	3
AR - Argentina	2
BG - Bulgaria	2
CL - Cile	2
DZ - Algeria	2
HU - Ungheria	2
LB - Libano	2
LK - Sri Lanka	2
PT - Portogallo	2
A2 - ???statistics.table.value.countryCode.A2???	1
AU - Australia	1
AZ - Azerbaigian	1
CZ - Repubblica Ceca	1
DK - Danimarca	1
EG - Egitto	1
GR - Grecia	1
JM - Giamaica	1
MA - Marocco	1
MY - Malesia	1
NI - Nicaragua	1
NZ - Nuova Zelanda	1
SC - Seychelles	1
SK - Slovacchia (Repubblica Slovacca)	1
TH - Thailandia	1
Totale	4.735

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Città	#
Chandler	354
Fairfield	243
Ashburn	175
Singapore	155
Cambridge	147
Boardman	142
Hong Kong	131
Woodbridge	125
Houston	115
Beijing	107
Ann Arbor	95
Wilmington	90
Seattle	83
Nyköping	82
Turin	81
New York	76
Rome	57
Jacksonville	49
Milan	49
San Mateo	45
Dublin	38
Des Moines	32
Toronto	31
Los Angeles	29
Helsinki	26
Brussels	23
Strasbourg	20
Berlin	19
Ogden	15
San Diego	15
Council Bluffs	14
Kraków	14
Las Vegas	14
London	14
Aachen	13
Hanover	13
Frankfurt am Main	11
Atlanta	10
Dearborn	10
Dong Ket	10
Vigevano	9
Miami	8
Oxford	8
West Jordan	8
Barnsley	7
Fasano	7
Johannesburg	7
Moscow	7
Redwood City	7
Tokyo	7
Warsaw	7
Amsterdam	6
Chicago	6
Naples	6
Cagliari	5
Chiswick	5
Guangzhou	5
Haifa	5
Leawood	5
Nicosia	5
Prescot	5
San Francisco	5
Tashkent	5
Walsall	5
Manchester	4
Modena	4
Quito	4
Redmond	4
Salerno	4
Shanghai	4
Shenzhen	4
Southwark	4
Vienna	4
Ankara	3
Avellino	3
Bangalore	3
Florence	3
Hanoi	3
Juiz de Fora	3
Lambeth	3
Mexico City	3
Mitcham	3
Nanjing	3
New Delhi	3
Nuremberg	3
Oristano	3
Slough	3
Tehran	3
Villafranca Piemonte	3
Acton	2
Ancona	2
Bandung	2
Borås	2
Brescia	2
Budapest	2
Catania	2
Central	2
Changsha	2
Cimahi	2
Cirié	2
Totale	3.028

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Nome	#
Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization	260
A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage	227
9th Young Researcher Meeting	224
Electrical Resistance Tomography of Conductive Thin Films	220
GRACE: Developing Electrical Characterisation Methods for Future Graphene Electronics	205
Electrical Resistance Tomography on thin films: Sharp conductive profiles	195
Mapping the conductivity of graphene with Electrical Resistance Tomography	182
A correlation noise spectrometer for flicker noise measurement in graphene samples	172
Good Practice Guide on the electrical characterisation of graphene using contact methods	172
Molecular doping and gas sensing in Si nanowires: From charge injection to reduced dielectric mismatch	171
A calibration-verification testbed for electrical energy meters under low power quality conditions	156
10th Young Researcher Meeting 2019	154
Good Practice Guide on the electrical characterisation of graphene using non-contact and high throughput methods	151
Un laboratorio di taratura e verifica dei contatori elettrici anche in condizioni di scarsa Power Quality	143
A calibration-verification testbed for electrical energy meters under low power quality conditions	141
GRACE — Methods for the Electrical Characterization of Graphene	132
Tomografia a resistenza elettrica applicata ai film sottili	115
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials	107
Calibration of lock-in amplifiers in the low-frequency range	101
A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems	101
Laboratory reproduction of on-field low power quality conditions for the calibration/verification of electrical energy meters	99
Accuracy in electrical resistance tomography: from measurements to maps	99
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison	91
Sistema automatico di taratura ZERA MTS310 e relativo software di controllo WinSAM: allestimenti circuitali e impostazione sequenze di misura	90
Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale	89
Normativa per le proprietà elettriche del grafene	89
Memristive devices as a potential resistance standard	74
EMPIR GRACE - Good Practice Guides on the electrical characterisation of graphene using contact- and non-contact methods	73
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality	72
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications	72
Un laboratorio per la riproduzione di condizioni di bassa power quality registrate sul campo per la taratura di contatori di energia attiva	63
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation	62
Smart Glasses for Visually Evoked Potential Applications: Characterisation of the Optical Output for Different Display Technologies	59
Implementation of electrical resistance tomography for conductivity mapping of nanostructured transparent conductor materials	47
Preface	47
LA TOMOGRAFIA A RESISTENZA ELETTRICA DI MATERIALI IN FILM SOTTILE: ATTIVITÀ IN INRIM E INTERAZIONE CON CONSORZI DI RICERCA	47
Reference data for Electrical Resistance Tomography	46
A laboratory for the reproduction of on-field low power quality for the calibration/verification of active energy meters	41
I PROGETTI EMPHASIS E METSUPERCAP PER LO SVILUPPO DEI SUPERCONDENSATORI	38
The project ‘Metrology for Static and Dynamic Characterization of Supercapacitors’ – MetSuperCap	35
Role of plasma-induced defects in the generation of 1/f noise in graphene	31
Tomography of memory engrams in self-organizing nanowire connectomes	27
null	26
Electrical resistance tomography as a characterisation tool for large-area graphene	22
Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory	21
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response	21
Memristive devices for metrological applications	20
Misure su effetto Hall quantistico in criostato senza elio	20
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy	18
Towards new IEC standards for the electrical characterization of graphene	17
Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters	15
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods	13
Totale	4.913

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Categoria	#
all - tutte	38.597
article - articoli	0
book - libri	0
conference - conferenze	0
curatela - curatele	0
other - altro	0
patent - brevetti	0
selected - selezionate	0
volume - volumi	0
Totale	38.597

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	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2019/2020	156	0	0	0	0	0	0	0	0	0	90	61	5
2020/2021	664	69	101	55	25	31	39	137	9	63	47	36	52
2021/2022	657	77	22	30	79	67	22	63	78	80	44	30	65
2022/2023	932	56	83	107	76	66	148	28	79	165	28	62	34
2023/2024	881	61	88	106	78	77	49	119	29	83	38	52	101
2024/2025	909	37	41	75	43	54	99	217	96	181	66	0	0
Totale													4.913