statistiche ricercatore

CULTRERA, ALESSANDRO

Distribuzione geografica

Continente	#
NA - Nord America	2.638
EU - Europa	1.539
AS - Asia	790
SA - Sud America	22
AF - Africa	12
Continente sconosciuto - Info sul continente non disponibili	8
OC - Oceania	2
Totale	5.011

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Nazione	#
US - Stati Uniti d'America	2.593
IT - Italia	494
SG - Singapore	300
SE - Svezia	298
CN - Cina	237
DE - Germania	230
UA - Ucraina	136
HK - Hong Kong	135
GB - Regno Unito	116
FR - Francia	65
FI - Finlandia	39
IE - Irlanda	38
CA - Canada	36
NL - Olanda	35
BE - Belgio	24
PL - Polonia	22
RU - Federazione Russa	18
UZ - Uzbekistan	16
IN - India	14
ID - Indonesia	13
VN - Vietnam	13
IL - Israele	11
JP - Giappone	11
BR - Brasile	10
KR - Corea	8
EU - Europa	7
IR - Iran	7
MX - Messico	7
ZA - Sudafrica	7
AT - Austria	6
CH - Svizzera	6
CY - Cipro	6
TR - Turchia	6
EC - Ecuador	4
AR - Argentina	3
BD - Bangladesh	3
CZ - Repubblica Ceca	3
SA - Arabia Saudita	3
VE - Venezuela	3
BG - Bulgaria	2
CL - Cile	2
DZ - Algeria	2
HU - Ungheria	2
LB - Libano	2
LK - Sri Lanka	2
PT - Portogallo	2
A2 - ???statistics.table.value.countryCode.A2???	1
AU - Australia	1
AZ - Azerbaigian	1
DK - Danimarca	1
EG - Egitto	1
GR - Grecia	1
JM - Giamaica	1
MA - Marocco	1
MY - Malesia	1
NI - Nicaragua	1
NZ - Nuova Zelanda	1
SC - Seychelles	1
SK - Slovacchia (Repubblica Slovacca)	1
TH - Thailandia	1
Totale	5.011

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Città	#
Chandler	354
Fairfield	243
Ashburn	175
Singapore	162
Beijing	157
Cambridge	147
Boardman	142
Hong Kong	131
Woodbridge	125
Houston	115
Ann Arbor	95
Wilmington	90
Seattle	83
Turin	83
Nyköping	82
New York	76
Rome	57
Milan	52
Jacksonville	49
San Mateo	45
Dublin	38
Des Moines	32
Toronto	31
Los Angeles	29
Helsinki	26
Berlin	24
Brussels	23
The Dalles	22
Strasbourg	20
Ogden	15
San Diego	15
Council Bluffs	14
Kraków	14
Las Vegas	14
London	14
Aachen	13
Hanover	13
Frankfurt am Main	11
Atlanta	10
Dearborn	10
Dong Ket	10
Vigevano	9
Amsterdam	8
Miami	8
Oxford	8
West Jordan	8
Barnsley	7
Fasano	7
Johannesburg	7
Moscow	7
Munich	7
Redwood City	7
Tokyo	7
Warsaw	7
Chicago	6
Naples	6
Cagliari	5
Chiswick	5
Guangzhou	5
Haifa	5
Leawood	5
Nicosia	5
Prescot	5
San Francisco	5
Tashkent	5
Turku	5
Walsall	5
Juiz de Fora	4
Manchester	4
Modena	4
Quito	4
Redmond	4
Salerno	4
Shanghai	4
Shenzhen	4
Southwark	4
Vienna	4
Ancona	3
Ankara	3
Avellino	3
Bangalore	3
Florence	3
Hanoi	3
Lambeth	3
Lappeenranta	3
Mexico City	3
Mitcham	3
Nanjing	3
New Delhi	3
Nuremberg	3
Oristano	3
Querétaro City	3
Santa Clara	3
Slough	3
Tehran	3
Villafranca Piemonte	3
Acton	2
Assago	2
Bandung	2
Borås	2
Totale	3.130

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Nome	#
Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization	263
A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage	229
9th Young Researcher Meeting	229
Electrical Resistance Tomography of Conductive Thin Films	223
GRACE: Developing Electrical Characterisation Methods for Future Graphene Electronics	209
Electrical Resistance Tomography on thin films: Sharp conductive profiles	198
Mapping the conductivity of graphene with Electrical Resistance Tomography	186
Good Practice Guide on the electrical characterisation of graphene using contact methods	176
A correlation noise spectrometer for flicker noise measurement in graphene samples	175
Molecular doping and gas sensing in Si nanowires: From charge injection to reduced dielectric mismatch	175
10th Young Researcher Meeting 2019	170
A calibration-verification testbed for electrical energy meters under low power quality conditions	164
Good Practice Guide on the electrical characterisation of graphene using non-contact and high throughput methods	156
A calibration-verification testbed for electrical energy meters under low power quality conditions	150
Un laboratorio di taratura e verifica dei contatori elettrici anche in condizioni di scarsa Power Quality	146
GRACE — Methods for the Electrical Characterization of Graphene	135
Tomografia a resistenza elettrica applicata ai film sottili	118
Laboratory reproduction of on-field low power quality conditions for the calibration/verification of electrical energy meters	116
Sistema automatico di taratura ZERA MTS310 e relativo software di controllo WinSAM: allestimenti circuitali e impostazione sequenze di misura	115
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials	112
Calibration of lock-in amplifiers in the low-frequency range	107
A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems	106
Accuracy in electrical resistance tomography: from measurements to maps	104
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison	96
Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale	95
Normativa per le proprietà elettriche del grafene	92
Memristive devices as a potential resistance standard	80
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality	77
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications	77
EMPIR GRACE - Good Practice Guides on the electrical characterisation of graphene using contact- and non-contact methods	76
Un laboratorio per la riproduzione di condizioni di bassa power quality registrate sul campo per la taratura di contatori di energia attiva	68
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation	65
Smart Glasses for Visually Evoked Potential Applications: Characterisation of the Optical Output for Different Display Technologies	64
LA TOMOGRAFIA A RESISTENZA ELETTRICA DI MATERIALI IN FILM SOTTILE: ATTIVITÀ IN INRIM E INTERAZIONE CON CONSORZI DI RICERCA	57
Implementation of electrical resistance tomography for conductivity mapping of nanostructured transparent conductor materials	50
Preface	50
Reference data for Electrical Resistance Tomography	49
A laboratory for the reproduction of on-field low power quality for the calibration/verification of active energy meters	49
I PROGETTI EMPHASIS E METSUPERCAP PER LO SVILUPPO DEI SUPERCONDENSATORI	42
The project ‘Metrology for Static and Dynamic Characterization of Supercapacitors’ – MetSuperCap	41
Role of plasma-induced defects in the generation of 1/f noise in graphene	34
Tomography of memory engrams in self-organizing nanowire connectomes	30
Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory	28
Memristive devices for metrological applications	28
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response	26
null	26
Electrical resistance tomography as a characterisation tool for large-area graphene	25
Misure su effetto Hall quantistico in criostato senza elio	24
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy	21
Towards new IEC standards for the electrical characterization of graphene	21
Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters	19
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods	17
Totale	5.189

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Categoria	#
all - tutte	41.137
article - articoli	0
book - libri	0
conference - conferenze	0
curatela - curatele	0
other - altro	0
patent - brevetti	0
selected - selezionate	0
volume - volumi	0
Totale	41.137

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	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2019/2020	5	0	0	0	0	0	0	0	0	0	0	0	5
2020/2021	664	69	101	55	25	31	39	137	9	63	47	36	52
2021/2022	657	77	22	30	79	67	22	63	78	80	44	30	65
2022/2023	932	56	83	107	76	66	148	28	79	165	28	62	34
2023/2024	881	61	88	106	78	77	49	119	29	83	38	52	101
2024/2025	1.185	37	41	75	43	54	99	217	96	181	92	222	28
Totale													5.189