At the conference we will present a first draft of a machine-readable refer- ence dataset structure for ERT measurements on thin film materials, based on XLM language. Reference data will include ERT measurements, along with a set of meta- data, such as information about the samples (geometry, materials), the measurement protocol used to perform the ERT multiterminal measurements, the measurements uncertainty, instrumentation specifications.
Reference data for Electrical Resistance Tomography / Cultrera, Alessandro; Germito, Gabriele; Callegaro, Luca. - (2023), pp. 112-113. (Intervento presentato al convegno Mathematical and Statistical Methods for Metrology Joint workshop of ENBIS and MATHMET tenutosi a Torino nel 30-31 Maggio 2023).
Reference data for Electrical Resistance Tomography
alessandro cultrera
;Gabriele Germito;Luca Callegaro
2023
Abstract
At the conference we will present a first draft of a machine-readable refer- ence dataset structure for ERT measurements on thin film materials, based on XLM language. Reference data will include ERT measurements, along with a set of meta- data, such as information about the samples (geometry, materials), the measurement protocol used to perform the ERT multiterminal measurements, the measurements uncertainty, instrumentation specifications.| File | Dimensione | Formato | |
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Abstract_MSMM_23_Cultre_ERT_reference_data.pdf
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