BELLOTTI, ROBERTO
BELLOTTI, ROBERTO
AE Metrologia applicata e ingegneria
3D characterization of printed structures by stylus- and optical-based measurements
2018 Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness
2023 Ribotta, Luigi; Giura, Andrea; Bellotti, Roberto; Zucco, Massimo
A function-driven characterization of printed conductors on PV cells
2018 Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support
2016 Jones, Christopher; Santiano, Marco; Downes, Stephen; Bellotti, Roberto; O’Connor, Daniel; Picotto, Gianbartolo
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires
2024 Ribotta, Luigi; Delvallée, Alexandra; Cara, Eleonora; Bellotti, Roberto; Giura, Andrea; DE CARLO, Ivan; Fretto, Matteo; Knulst, Walter; Koops, Richard; Torre, Bruno; Boarino, Luca
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes
2022 Bellotti, Roberto; Picotto Gian, Bartolo; Ribotta, Luigi
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016)
2020 Coveney, Tim; Matus, Michael; Wang, Shihua; Byman, Ville; Lassila, Antti; Alqahtani, Nasser; Alqahtani, Faisal; Sumner, Dean; Spiller, Jürg; Meli, Felix; Picotto, Gian Bartolo; Bellotti, Roberto; Sato, Osamu; Sharma, Rina; Moona, Girija; Kumar, Vinod; Rodríguez, Joaquín; Prieto, Emilio; Meral, İlker; Ganioğlu, Okhan; Salgado, José; Wójtowicz, Adam; Skalník, Pavel; Zelený, Vít; Stoup, John; Kotte, Gerard; Koops, Richard; Arizmendi, Edgar; Wang, Weinong; Jakobsson, Agneta; Duta, Alexandru; Dugheanu, Elena; Reain, Greg; Szikszai, Gábor
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale
2020 Picotto, Gian Bartolo; Bellotti, Roberto; Sosso, Andrea
Droplet volume variability as a critical factor for accuracy of absolute quantification using droplet digital PCR
2017 Bogožalec Košir, Alexandra; Divieto, Carla; Pavšič, Jernej; Pavarelli, Stefano; Dobnik, David; Dreo, Tanja; Bellotti, Roberto; Sassi, MARIA PAOLA; Žel, Jana
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges'
2015 Mudronja, Vedran; Šimunovic, Vedran; Acko, Bojan; Matus, Michael; Bánréti, Edit; István, Dicso; Thalmann, Rudolf; Lassila, Antti; Lillepea, Lauri; Picotto, Gianbartolo; Bellotti, Roberto; Pometto, Marco; Ganioglu, Okhan; Meral, Ilker; Antonio Salgado, José; Georges, Vailleau
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10
2024 Ribotta, Luigi; Destefano, Elisa; Guendouli, Anas; Giura, Andrea; Bellotti, Roberto; Zucco, Massimo
Metrological features of the Large Piston Prover at INRIM
2022 Piccato, Aline; Bisi, Marco; Giorgio Spazzini, Pier; Bertiglia, Fabio; La Piana, Gaetano; Audrito, Emanuele; Santiano, Marco; Bellotti, Roberto; Francese, Claudio
Morphology-driven parameters of engineered functional surfaces
2017 Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs
2023 Ribotta, Luigi; Cara, Eleonora; Bellotti, Roberto; DE CARLO, Ivan; Fretto, Matteo; Delvallée, Alexandra; Knulst, Walter; Koops, Richard; Torre, Bruno; Boarino, Luca
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells
2019 Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi
Recent advances of the metrological AFM at INRIM
2014 Bellotti, R.; Picotto, Gianbartolo
Renewal of the gage-block interferometer at INRIM
2015 Bellotti, Roberto; Franco, Mauro; Picotto, Gianbartolo; Pometto, Marco
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM
2024 Ribotta, Luigi; Delvallée, Alexandra; Cara, Eleonora; Bellotti, Roberto; Giura, Andrea; DE CARLO, Ivan; Fretto, Matteo; Knulst, Walter; Koops, Richard; Torre, Bruno; Saghi, Zineb; Boarino, Luca
Strain measurements of cylinder magnetostrictive samples by interferometer readings
2017 Bellotti, Roberto; Mei, Pasquale; Picotto, Gianbartolo; Santiano, Marco; Zucca, Mauro
Traceable Dimensional Metrology of Nanoparticles and Nanostructures
2022 Ribotta, Luigi; Bellotti, Roberto; Giura, Andrea; Zucco, Massimo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| 3D characterization of printed structures by stylus- and optical-based measurements / Bellotti, Roberto; Maras, Claire; Picotto, Gian Bartolo; Pometto, Marco; Ribotta, Luigi. - (2018), pp. 493-494. (Intervento presentato al convegno 18th international conference of the european society for precision engineering and nanotechnology tenutosi a Venice, Italy nel Monday 4th to Friday 8th June 2018). | 2018 | Bellotti, RobertoPicotto, Gian BartoloPometto, MarcoRibotta, Luigi + | 3D characterization of printed structures by stylus- and optical-based measurements_euspen 2018 .pdf |
| A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness / Ribotta, Luigi; Giura, Andrea; Bellotti, Roberto; Zucco, Massimo. - (2023). (Intervento presentato al convegno NanoScale 2023 (Euramet)). | 2023 | Luigi RibottaAndrea GiuraRoberto BellottiMassimo Zucco | Poster Ribotta NanoScale 2023 - MG.pdf |
| A function-driven characterization of printed conductors on PV cells / Bellotti, Roberto; Furin, Valentina; Maras, Claire; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 6:2(2018), p. 025002. [10.1088/2051-672x/aabe20] | 2018 | Roberto BellottiGianbartolo PicottoLuigi Ribotta + | Bellotti_2018_Surf._Topogr.__Metrol._Prop._6_025002.pdf; A function-driven characterization of printed conductors on PV cells_submitted manuscript.pdf |
| A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support / Jones, Christopher; Santiano, Marco; Downes, Stephen; Bellotti, Roberto; O’Connor, Daniel; Picotto, Gianbartolo. - P1.63(2016), pp. 171-172. (Intervento presentato al convegno Euspen’s 16th International Conference & Exhibition tenutosi a Nottingham (UK) nel May 30th – 3rd June 2016). | 2016 | Marco SantianoRoberto BellottiGianbartolo Picotto + | A universal substrate ... Proc. EUSPEN 2016.pdf |
| AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires / Ribotta, Luigi; Delvallée, Alexandra; Cara, Eleonora; Bellotti, Roberto; Giura, Andrea; DE CARLO, Ivan; Fretto, Matteo; Knulst, Walter; Koops, Richard; Torre, Bruno; Boarino, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 1361-6501. - (2024). [10.1088/1361-6501/ad5e9f] | 2024 | Luigi RibottaEleonora CaraRoberto BellottiAndrea GiuraIvan De CarloMatteo FrettoBruno TorreLuca Boarino + | Ribotta_2024_Meas._Sci._Technol._35_105014.pdf |
| AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes / Bellotti, Roberto; Picotto Gian, Bartolo; Ribotta, Luigi. - In: NANOMANUFACTURING AND METROLOGY. - ISSN 2520-8128. - (2022). [10.1007/s41871-022-00125-x] | 2022 | Bellotti RobertoRibotta Luigi + | Bellotti2022.pdf |
| Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) / Coveney, Tim; Matus, Michael; Wang, Shihua; Byman, Ville; Lassila, Antti; Alqahtani, Nasser; Alqahtani, Faisal; Sumner, Dean; Spiller, Jürg; Meli, Felix; Picotto, Gian Bartolo; Bellotti, Roberto; Sato, Osamu; Sharma, Rina; Moona, Girija; Kumar, Vinod; Rodríguez, Joaquín; Prieto, Emilio; Meral, İlker; Ganioğlu, Okhan; Salgado, José; Wójtowicz, Adam; Skalník, Pavel; Zelený, Vít; Stoup, John; Kotte, Gerard; Koops, Richard; Arizmendi, Edgar; Wang, Weinong; Jakobsson, Agneta; Duta, Alexandru; Dugheanu, Elena; Reain, Greg; Szikszai, Gábor. - In: METROLOGIA. - ISSN 0026-1394. - 57:1A(2020), pp. 04002-04002. [10.1088/0026-1394/57/1A/04002] | 2020 | Picotto, Gian BartoloBellotti, Roberto + | EURAMET.L-K5-2016.pdf |
| Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale / Picotto, Gian Bartolo; Bellotti, Roberto; Sosso, Andrea. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 31:10(2020), p. 104006. [10.1088/1361-6501/ab9038] | 2020 | Picotto, Gian BartoloBellotti, RobertoSosso, Andrea | Picotto+et+al_2020_Meas._Sci._Technol._10.1088_1361-6501_ab9038_accepted manuscript.pdf; Picotto_2020_Meas._Sci._Technol._31_104006.pdf |
| Droplet volume variability as a critical factor for accuracy of absolute quantification using droplet digital PCR / Bogožalec Košir, Alexandra; Divieto, Carla; Pavšič, Jernej; Pavarelli, Stefano; Dobnik, David; Dreo, Tanja; Bellotti, Roberto; Sassi, MARIA PAOLA; Žel, Jana. - In: ANALYTICAL AND BIOANALYTICAL CHEMISTRY. - ISSN 1618-2642. - 409:28(2017), pp. 6689-6697. [10.1007/s00216-017-0625-y] | 2017 | Carla DivietoStefano PavarelliRoberto BellottiMaria Paola Sassi + | 216_2017_Article_625.pdf |
| Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' / Mudronja, Vedran; Šimunovic, Vedran; Acko, Bojan; Matus, Michael; Bánréti, Edit; István, Dicso; Thalmann, Rudolf; Lassila, Antti; Lillepea, Lauri; Picotto, Gianbartolo; Bellotti, Roberto; Pometto, Marco; Ganioglu, Okhan; Meral, Ilker; Antonio Salgado, José; Georges, Vailleau. - In: METROLOGIA. - ISSN 0026-1394. - 52:1A(2015), pp. 04003-04003. [10.1088/0026-1394/52/1A/04003] | 2015 | Picotto, GianbartoloBellotti, RobertoPOMETTO, MARCO + | EURAMET.L-S21.pdf |
| Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 / Ribotta, Luigi; Destefano, Elisa; Guendouli, Anas; Giura, Andrea; Bellotti, Roberto; Zucco, Massimo. - (2024). | 2024 | Luigi RibottaAndrea GiuraRoberto BellottiMassimo Zucco + | RT-2024-14.pdf |
| Metrological features of the Large Piston Prover at INRIM / Piccato, Aline; Bisi, Marco; Giorgio Spazzini, Pier; Bertiglia, Fabio; La Piana, Gaetano; Audrito, Emanuele; Santiano, Marco; Bellotti, Roberto; Francese, Claudio. - In: MEASUREMENT. - ISSN 0263-2241. - (2022). [10.1016/j.measurement.2022.110841] | 2022 | Piccato, AlineBisi, MarcoGiorgio Spazzini, PierBertiglia, FabioLa Piana, GaetanoAudrito, EmanueleSantiano, MarcoBellotti, RobertoFrancese, Claudio | 1-s2.0-S026322412200135X-main.pdf; MEAS-D-21-05579_R2.pdf |
| Morphology-driven parameters of engineered functional surfaces / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - (2017). (Intervento presentato al convegno MacroScale 2017 - Recent Developments in Traceable Dimensional Measurements tenutosi a Espoo, Finland nel October 17th to 19th, 2017). | 2017 | Bellotti, RobertoPicotto GianbartoloRIBOTTA, LUIGI + | - |
| Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs / Ribotta, Luigi; Cara, Eleonora; Bellotti, Roberto; DE CARLO, Ivan; Fretto, Matteo; Delvallée, Alexandra; Knulst, Walter; Koops, Richard; Torre, Bruno; Boarino, Luca. - (2023). (Intervento presentato al convegno NanoScale 2023 (Euramet)). | 2023 | Luigi RibottaEleonora CaraRoberto BellottiIvan De CarloMatteo FrettoBruno TorreLuca Boarino + | Poster Ribotta NanoScale 2023 - Nanowires.pdf |
| Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Picotto, Gianbartolo; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 7:3(2019), p. 035009. [10.1088/2051-672x/ab370e] | 2019 | Roberto BellottiGianbartolo PicottoLuigi Ribotta + | Bellotti_2019_Surf._Topogr.__Metrol._Prop._7_035009.pdf; Bellotti+et+al_2019_Surf._Topogr.__Metrol._Prop._10.1088_2051-672X_ab370e_Accepted Manuscript.pdf |
| Recent advances of the metrological AFM at INRIM / Bellotti, R.; Picotto, Gianbartolo. - 9173:(2014), p. 917304. (Intervento presentato al convegno Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII, 917304 (27 August 2014) tenutosi a San Diego (USA) nel 27 August 2014) [10.1117/12.2061954]. | 2014 | Bellotti, R.Picotto, Gianbartolo | - |
| Renewal of the gage-block interferometer at INRIM / Bellotti, Roberto; Franco, Mauro; Picotto, Gianbartolo; Pometto, Marco. - MacroScale website papers:(2015). (Intervento presentato al convegno MacroScale 2014 - Recent developments in traceable dimensional measurements tenutosi a Vienna (Austria) nel 28th-30th October 2014) [10.7795/810.20150331A]. | 2015 | Bellotti, RobertoFRANCO, MAUROPicotto, GianbartoloPometto, Marco | Renewal of .. Macroscale2014.pdf |
| Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM / Ribotta, Luigi; Delvallée, Alexandra; Cara, Eleonora; Bellotti, Roberto; Giura, Andrea; DE CARLO, Ivan; Fretto, Matteo; Knulst, Walter; Koops, Richard; Torre, Bruno; Saghi, Zineb; Boarino, Luca. - (2024). | 2024 | Luigi RibottaEleonora CaraRoberto BellottiAndrea GiuraIvan De CarloMatteo FrettoBruno TorreLuca Boarino + | - |
| Strain measurements of cylinder magnetostrictive samples by interferometer readings / Bellotti, Roberto; Mei, Pasquale; Picotto, Gianbartolo; Santiano, Marco; Zucca, Mauro. - P6.19(2017), pp. 379-380. (Intervento presentato al convegno 17th International EUSPEN Conference & Exhibition tenutosi a Hannover (DE) nel 29th May - 2nd June 2017). | 2017 | Bellotti, RobertoPicotto, GianbartoloSantiano, MarcoZucca, Mauro + | Strain measurements ..._EUSPEN Conf Proceedings 2017.pdf |
| Traceable Dimensional Metrology of Nanoparticles and Nanostructures / Ribotta, Luigi; Bellotti, Roberto; Giura, Andrea; Zucco, Massimo. - (2022). | 2022 | Luigi RibottaBellotti RobertoAndrea GiuraMassimo Zucco | NanoInnovation+2022.pdf |