METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

BELLOTTI, ROBERTO
 Distribuzione geografica
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Continente #
NA - Nord America 1.331
EU - Europa 1.006
AS - Asia 495
SA - Sud America 21
AF - Africa 4
OC - Oceania 4
Continente sconosciuto - Info sul continente non disponibili 2
Totale 2.863
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Nazione #
US - Stati Uniti d'America 1.316
IT - Italia 325
SG - Singapore 203
HK - Hong Kong 164
SE - Svezia 161
GB - Regno Unito 141
DE - Germania 127
UA - Ucraina 90
CN - Cina 71
FR - Francia 65
BR - Brasile 15
FI - Finlandia 15
NL - Olanda 15
BE - Belgio 13
PL - Polonia 13
IE - Irlanda 12
IN - India 11
JP - Giappone 9
CA - Canada 8
RU - Federazione Russa 8
VN - Vietnam 8
KR - Corea 6
CH - Svizzera 5
MX - Messico 5
TW - Taiwan 5
RO - Romania 4
TR - Turchia 4
AT - Austria 3
CO - Colombia 3
AU - Australia 2
AZ - Azerbaigian 2
EC - Ecuador 2
EE - Estonia 2
EU - Europa 2
ID - Indonesia 2
NZ - Nuova Zelanda 2
PA - Panama 2
PT - Portogallo 2
TN - Tunisia 2
ZA - Sudafrica 2
BD - Bangladesh 1
CZ - Repubblica Ceca 1
ES - Italia 1
IL - Israele 1
IR - Iran 1
KG - Kirghizistan 1
KW - Kuwait 1
LK - Sri Lanka 1
MD - Moldavia 1
MY - Malesia 1
NO - Norvegia 1
NP - Nepal 1
RS - Serbia 1
SA - Arabia Saudita 1
TH - Thailandia 1
VE - Venezuela 1
Totale 2.863
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Città #
Cambridge 246
Hong Kong 159
Chandler 147
Singapore 125
Turin 102
Fairfield 100
Ann Arbor 78
Ashburn 77
Boardman 63
Seattle 46
Falkenstein 42
Jacksonville 42
Houston 39
Beijing 38
Nyköping 36
Woodbridge 36
Wilmington 32
Strasbourg 31
Rome 28
New York 25
San Mateo 24
Des Moines 22
Council Bluffs 16
Los Angeles 15
Brussels 13
Milan 13
Dublin 12
Genoa 12
Munich 12
Helsinki 11
Amsterdam 10
Dearborn 9
London 9
Tokyo 9
Ogden 8
Braunschweig 7
Dong Ket 7
Warsaw 7
Assago 6
Atlanta 6
Hanover 6
San Diego 6
Toronto 6
Brooklyn 5
Pisa 5
Las Vegas 4
Phoenix 4
Suwon 4
São Paulo 4
Taichung 4
The Dalles 4
West Jordan 4
Zurich 4
Abbiategrasso 3
Bologna 3
Frankfurt am Main 3
Guangzhou 3
Krakow 3
Miami 3
Nanjing 3
Nuremberg 3
Redwood City 3
San Francisco 3
Torino 3
Vigliano Biellese 3
Baku 2
Bogotá 2
Bonate Sopra 2
Boston 2
Boves 2
Candiolo 2
Cinisello Balsamo 2
Crescentino 2
Harbin 2
Islington 2
Jakarta 2
Johannesburg 2
Kraków 2
Lappeenranta 2
Moscow 2
Naples 2
Ottawa 2
Paderborn 2
Paris 2
Piovera 2
Prescot 2
San Mauro Torinese 2
Shanghai 2
Tallinn 2
Timișoara 2
Torrazza Coste 2
Vienna 2
Zanica 2
Aguascalientes 1
Altagracia de Orituco 1
Ames 1
Ancona 1
Ankara 1
Auckland 1
Belgrade 1
Totale 1.879
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Nome #
Recent advances of the metrological AFM at INRIM 256
Strain measurements of cylinder magnetostrictive samples by interferometer readings 229
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 217
Morphology-driven parameters of engineered functional surfaces 217
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 200
Renewal of the gage-block interferometer at INRIM 183
Droplet volume variability as a critical factor for accuracy of absolute quantification using droplet digital PCR 175
A function-driven characterization of printed conductors on PV cells 171
3D characterization of printed structures by stylus- and optical-based measurements 160
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 142
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 126
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 125
Analisi delle incertezze associate al campione nazionale di portate di gas dell’INRIM denominato MeGas 124
Metrological features of the Large Piston Prover at INRIM 96
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 91
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 73
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 63
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 62
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 62
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 56
Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for spring constant 52
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 47
From data to nutrition: the impact of computing infrastructure and artificial intelligence 37
Totale 2.964
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Categoria #
all - tutte 20.620
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 20.620
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20202 0 0 0 0 0 0 0 0 0 0 0 2
2020/2021418 46 22 59 11 58 23 47 13 50 47 24 18
2021/2022265 42 27 16 21 25 6 14 20 25 24 12 33
2022/2023377 41 35 31 51 33 57 20 30 28 10 21 20
2023/2024343 23 12 28 33 30 21 41 15 55 17 23 45
2024/2025884 47 22 54 18 48 55 50 71 227 57 95 140
Totale 2.964