METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

BELLOTTI, ROBERTO
 Distribuzione geografica
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Continente #
NA - Nord America 1.674
EU - Europa 1.176
AS - Asia 917
SA - Sud America 107
AF - Africa 31
OC - Oceania 6
Continente sconosciuto - Info sul continente non disponibili 3
Totale 3.914
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Nazione #
US - Stati Uniti d'America 1.626
SG - Singapore 387
IT - Italia 381
CN - Cina 173
SE - Svezia 172
HK - Hong Kong 169
GB - Regno Unito 167
DE - Germania 147
UA - Ucraina 91
BR - Brasile 86
FR - Francia 86
KR - Corea 56
VN - Vietnam 38
PL - Polonia 31
IN - India 27
CA - Canada 24
JP - Giappone 23
MX - Messico 18
ZA - Sudafrica 18
FI - Finlandia 17
NL - Olanda 15
BE - Belgio 13
IE - Irlanda 12
AT - Austria 8
RU - Federazione Russa 8
TR - Turchia 8
CH - Svizzera 7
EC - Ecuador 7
ID - Indonesia 7
CO - Colombia 6
ES - Italia 6
AR - Argentina 5
TW - Taiwan 5
AU - Australia 4
BD - Bangladesh 4
EG - Egitto 4
RO - Romania 4
AZ - Azerbaigian 3
LT - Lituania 3
CR - Costa Rica 2
EE - Estonia 2
EU - Europa 2
IQ - Iraq 2
NP - Nepal 2
NZ - Nuova Zelanda 2
PA - Panama 2
PT - Portogallo 2
TH - Thailandia 2
TN - Tunisia 2
VE - Venezuela 2
AO - Angola 1
CZ - Repubblica Ceca 1
DO - Repubblica Dominicana 1
DZ - Algeria 1
GA - Gabon 1
IL - Israele 1
IR - Iran 1
JM - Giamaica 1
KE - Kenya 1
KG - Kirghizistan 1
KW - Kuwait 1
LB - Libano 1
LK - Sri Lanka 1
MA - Marocco 1
MD - Moldavia 1
MY - Malesia 1
NO - Norvegia 1
PH - Filippine 1
PS - Palestinian Territory 1
PY - Paraguay 1
RS - Serbia 1
SA - Arabia Saudita 1
SN - Senegal 1
UG - Uganda 1
UZ - Uzbekistan 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 3.914
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Città #
Cambridge 246
Singapore 221
Hong Kong 164
Chandler 147
Ashburn 139
Turin 111
Fairfield 100
Ann Arbor 78
Beijing 69
Boardman 64
New York 51
Seattle 49
Seoul 49
Houston 44
Falkenstein 42
Jacksonville 42
Los Angeles 37
Nyköping 36
Woodbridge 36
Rome 34
Wilmington 32
Strasbourg 31
San Mateo 24
Genoa 23
Tokyo 23
Des Moines 22
Milan 22
Dallas 21
Munich 20
Warsaw 17
Council Bluffs 16
London 16
Atlanta 13
Brooklyn 13
Brussels 13
Helsinki 13
São Paulo 13
Dublin 12
Stockholm 12
Boston 11
Frankfurt am Main 11
Amsterdam 10
Montreal 10
Phoenix 10
Toronto 10
Dearborn 9
Santa Clara 9
Chennai 8
Hanoi 8
Ho Chi Minh City 8
Manchester 8
Mexico City 8
Ogden 8
Braunschweig 7
Chicago 7
Denver 7
Dong Ket 7
Johannesburg 7
Assago 6
Hanover 6
Krakow 6
Mumbai 6
Pisa 6
San Diego 6
Ankara 5
Nuremberg 5
San Francisco 5
Wroclaw 5
Bexley 4
Columbus 4
Guangzhou 4
Las Vegas 4
Miami 4
Orem 4
Rio de Janeiro 4
Suwon 4
Taichung 4
The Dalles 4
West Jordan 4
Xi'an 4
Zurich 4
Abbiategrasso 3
Annapolis 3
Baku 3
Bologna 3
Goiânia 3
Nanjing 3
Naples 3
Poplar 3
Redwood City 3
Roubaix 3
Segrate 3
Sydney 3
Torino 3
Vigliano Biellese 3
Biên Hòa 2
Bogotá 2
Bonate Sopra 2
Boves 2
Cairo 2
Totale 2.438
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Nome #
Recent advances of the metrological AFM at INRIM 281
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 261
Morphology-driven parameters of engineered functional surfaces 252
Strain measurements of cylinder magnetostrictive samples by interferometer readings 249
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 237
Analisi delle incertezze associate al campione nazionale di portate di gas dell’INRIM denominato MeGas 225
Renewal of the gage-block interferometer at INRIM 222
A function-driven characterization of printed conductors on PV cells 215
Droplet volume variability as a critical factor for accuracy of absolute quantification using droplet digital PCR 213
3D characterization of printed structures by stylus- and optical-based measurements 204
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 177
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 163
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 155
Metrological features of the Large Piston Prover at INRIM 145
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 131
From data to nutrition: the impact of computing infrastructure and artificial intelligence 118
Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for spring constant 113
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 109
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 103
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 101
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 93
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 88
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 80
Design and development of the Moore three axis measuring machine control system 47
Development of control programs for automatic calibration of roughness and step standards 39
Totale 4.021
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Categoria #
all - tutte 25.116
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 25.116
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021291 0 0 0 11 58 23 47 13 50 47 24 18
2021/2022265 42 27 16 21 25 6 14 20 25 24 12 33
2022/2023377 41 35 31 51 33 57 20 30 28 10 21 20
2023/2024343 23 12 28 33 30 21 41 15 55 17 23 45
2024/2025899 47 22 54 18 48 55 50 71 227 57 95 155
2025/20261.042 142 220 179 501 0 0 0 0 0 0 0 0
Totale 4.021