METRICA, l’archivio istituzionale della produzione scientifica dell’Istituto Nazionale di Ricerca Metrologica, ha lo scopo di raccogliere, documentare, conservare e pubblicare, anche ad accesso aperto, i prodotti della ricerca dell’Ente. METRICA utilizza la piattaforma IRIS (Institutional Research Information System) sviluppata da Cineca.

BELLOTTI, ROBERTO
 Distribuzione geografica
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Continente #
NA - Nord America 1.411
EU - Europa 1.088
AS - Asia 602
SA - Sud America 68
AF - Africa 10
OC - Oceania 6
Continente sconosciuto - Info sul continente non disponibili 2
Totale 3.187
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Nazione #
US - Stati Uniti d'America 1.391
IT - Italia 345
SG - Singapore 261
HK - Hong Kong 167
SE - Svezia 164
GB - Regno Unito 147
DE - Germania 146
UA - Ucraina 91
CN - Cina 87
FR - Francia 82
BR - Brasile 53
VN - Vietnam 23
PL - Polonia 21
FI - Finlandia 15
IN - India 15
NL - Olanda 15
BE - Belgio 13
IE - Irlanda 12
JP - Giappone 11
CA - Canada 10
AT - Austria 8
RU - Federazione Russa 8
CH - Svizzera 7
KR - Corea 6
MX - Messico 6
CO - Colombia 5
TR - Turchia 5
TW - Taiwan 5
AR - Argentina 4
AU - Australia 4
EC - Ecuador 4
ID - Indonesia 4
RO - Romania 4
ZA - Sudafrica 4
AZ - Azerbaigian 2
BD - Bangladesh 2
EE - Estonia 2
EU - Europa 2
IQ - Iraq 2
NP - Nepal 2
NZ - Nuova Zelanda 2
PA - Panama 2
PT - Portogallo 2
TN - Tunisia 2
CR - Costa Rica 1
CZ - Repubblica Ceca 1
DO - Repubblica Dominicana 1
ES - Italia 1
GA - Gabon 1
IL - Israele 1
IR - Iran 1
KE - Kenya 1
KG - Kirghizistan 1
KW - Kuwait 1
LB - Libano 1
LK - Sri Lanka 1
LT - Lituania 1
MA - Marocco 1
MD - Moldavia 1
MY - Malesia 1
NO - Norvegia 1
PS - Palestinian Territory 1
PY - Paraguay 1
RS - Serbia 1
SA - Arabia Saudita 1
TH - Thailandia 1
UG - Uganda 1
VE - Venezuela 1
Totale 3.187
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Città #
Cambridge 246
Hong Kong 162
Singapore 159
Chandler 147
Turin 105
Fairfield 100
Ashburn 87
Ann Arbor 78
Boardman 63
Beijing 54
Seattle 46
Falkenstein 42
Jacksonville 42
Houston 39
Nyköping 36
Woodbridge 36
Rome 33
Wilmington 32
Strasbourg 31
New York 28
San Mateo 24
Des Moines 22
Los Angeles 20
Munich 20
Council Bluffs 16
Brussels 13
Milan 13
Brooklyn 12
Dublin 12
Genoa 12
Frankfurt am Main 11
Helsinki 11
Tokyo 11
Amsterdam 10
London 10
Dearborn 9
Atlanta 8
Boston 8
Ogden 8
Braunschweig 7
Dong Ket 7
São Paulo 7
Warsaw 7
Assago 6
Dallas 6
Hanover 6
Krakow 6
San Diego 6
Toronto 6
Nuremberg 5
Phoenix 5
Pisa 5
Wroclaw 5
Bexley 4
Chennai 4
Columbus 4
Hanoi 4
Ho Chi Minh City 4
Las Vegas 4
San Francisco 4
Santa Clara 4
Stockholm 4
Suwon 4
Taichung 4
The Dalles 4
West Jordan 4
Zurich 4
Abbiategrasso 3
Bologna 3
Guangzhou 3
Johannesburg 3
Miami 3
Nanjing 3
Naples 3
Redwood City 3
Roubaix 3
Segrate 3
Sydney 3
Torino 3
Vigliano Biellese 3
Ankara 2
Baku 2
Bogotá 2
Bonate Sopra 2
Boves 2
Candiolo 2
Chicago 2
Cinisello Balsamo 2
Crescentino 2
Fragagnano 2
Goiânia 2
Guarulhos 2
Guayaquil 2
Haiphong 2
Harbin 2
Islington 2
Jakarta 2
Kansas City 2
Kraków 2
Lappeenranta 2
Totale 2.035
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Nome #
Recent advances of the metrological AFM at INRIM 267
Strain measurements of cylinder magnetostrictive samples by interferometer readings 234
Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges' 230
Morphology-driven parameters of engineered functional surfaces 227
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support 210
Analisi delle incertezze associate al campione nazionale di portate di gas dell’INRIM denominato MeGas 198
Renewal of the gage-block interferometer at INRIM 196
A function-driven characterization of printed conductors on PV cells 183
Droplet volume variability as a critical factor for accuracy of absolute quantification using droplet digital PCR 183
3D characterization of printed structures by stylus- and optical-based measurements 172
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells 151
Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) 137
Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale 134
Metrological features of the Large Piston Prover at INRIM 107
Nanodimensional characterization on nanowires: an interlaboratory comparison between AFMs 104
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes 82
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires 77
Metrological Confirmation of the Stylus Profilometer Taylor Hobson Form Talysurf PGI Novus S 10 73
Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for spring constant 69
Traceable Dimensional Metrology of Nanoparticles and Nanostructures 69
A case study for quantitative 3D optical characterization of machined technical surface of a cylindrical master roughness 63
From data to nutrition: the impact of computing infrastructure and artificial intelligence 62
Silicon nanowires: fabrication and quantitative dimensional characterisation by AFM 59
Design and development of the Moore three axis measuring machine control system 2
Totale 3.289
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Categoria #
all - tutte 22.630
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 22.630
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021372 0 22 59 11 58 23 47 13 50 47 24 18
2021/2022265 42 27 16 21 25 6 14 20 25 24 12 33
2022/2023377 41 35 31 51 33 57 20 30 28 10 21 20
2023/2024343 23 12 28 33 30 21 41 15 55 17 23 45
2024/2025899 47 22 54 18 48 55 50 71 227 57 95 155
2025/2026310 142 168 0 0 0 0 0 0 0 0 0 0
Totale 3.289