MASSA, ENRICO
MASSA, ENRICO
AE Metrologia applicata e ingegneria
A finite element analysis of surface-stress effects on measurement of the Si lattice parameter
2013 Quagliotti, D; Mana, Giovanni; Massa, Enrico; Sasso, CARLO PAOLO; Kuetgens, U.
A micro-manipulator for scanning x-ray interferometry
2001 Durando, Giovanni; Massa, Enrico
A More Accurate Measurement of the Si-28 Lattice Parameter
2015 Massa, Enrico; Sasso, CARLO PAOLO; Mana, Giovanni; Palmisano, C.
A new 28Si single crystal: counting the atoms for the new kilogram definition
2017 Bartl, G; Becker, P; Beckhoff, B; Bettin, H; Beyer, E; Borys, M; Busch, I; Cibik, L; D'Agostino, Giancarlo; Darlatt, E; Di Luzio, M; Fujii, K; Fujimoto, H; Fujita, K; Kolbe, M; Krumrey, M; Kuramoto, N; Massa, Enrico; Mecke, M; Mizushima, S; Müller, M; Narukawa, T; Nicolaus, A; Pramann, A; Rauch, D; Rienitz, O; Sasso, C. P; Stopic, A; Stosch, R; Waseda, A; Wundrack, S; Zhang, L; Zhang, X. W.
A new analysis for diffraction correction in optical interferometry
2017 Mana, G; Massa, E; Sasso, C. P; Andreas, B; Kuetgens, U.
A new scanning x-ray interferometer
2000 A., Bergamin; G., Cavagnero; Mana, Giovanni; Massa, Enrico; G., Zosi
A two thickness interferometer for lattice strain investigations
2016 Massa, Enrico; Melis, Claudio; Sasso, Carlo Paolo; Kuetgens, Ulrich; Mana, Giovanni
A two-axis tip-tilt platform for x-ray interferometry
2003 Bergamin, A; Cavagnero, G; Durando, Giovanni; Mana, Giovanni; Massa, Enrico
Aberration effects in two-beam laser interferometers
2006 Cavagnero, Giovanni; Mana, Giovanni; Massa, Enrico
Accuracy of laser beam center and width calculations
2001 Mana, Giovanni; Massa, Enrico; Rovera, A.
Accuracy of Temperature Measurements of the Avogadro-Project
2018 Massa, Enrico; Mai, Torsten; Kuramoto, Naoki; Nicolaus, Arnold; Friedrich, Kathrin; Sasso, Carlo Paolo; Eppers, Daniela; Fujii, Kenichi
Accurate measurements of the Avogadro and Planck constants by counting silicon atoms
2013 Bettin, H; Fujii, K; Man, J; Mana, Giovanni; Massa, Enrico; Picard, A.
ADVANCES IN THE MEASUREMENT OF THE 28Si LATTICE PARAMETER
2010 Massa, Enrico; Mana, Giovanni; Kessler, E. G.
An automated resistor network to inspect the linearity of resistance-thermometry measurements
2013 Massa, Enrico; Mana, Giovanni
Assessment of the accuracy of the 28Si (220) plane spacing
2014 Mana, G.; Massa, E.; Sasso, C.
Avogadro and Planck Constants, Two Pillars of the International System of Units
2024 Massa, Enrico
Avogadro constant measurements using enriched 28Si monocrystals
2018 Fujii, K; Massa, E; Bettin, H; Kuramoto, N; Mana, G
Avogadro, Planck and the kilogram redefinition
2021 Massa, Enrico
Bayesian model selection applied to linear regressions with weighted data
2019 Mana, Giovanni; Massa, Enrico; Sasso, Carlo Paolo
Calibration of a silicon crystal for absolute nuclear spectroscopy
2010 Massa, Enrico; Mana, Giovanni; Kuetgens, U; Ferroglio, L.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A finite element analysis of surface-stress effects on measurement of the Si lattice parameter / Quagliotti, D; Mana, Giovanni; Massa, Enrico; Sasso, CARLO PAOLO; Kuetgens, U.. - In: METROLOGIA. - ISSN 0026-1394. - 50:3(2013), pp. 243-248. [10.1088/0026-1394/50/3/243] | 2013 | MANA, GIOVANNIMASSA, ENRICOSASSO, CARLO PAOLO + | - |
| A micro-manipulator for scanning x-ray interferometry / Durando, Giovanni; Massa, Enrico. - 2:(2001), pp. 426-429. (Intervento presentato al convegno 2nd euspen International Conference tenutosi a Turin nel 27 - 31 MAY). | 2001 | DURANDO, GIOVANNIMASSA, ENRICO | - |
| A More Accurate Measurement of the Si-28 Lattice Parameter / Massa, Enrico; Sasso, CARLO PAOLO; Mana, Giovanni; Palmisano, C.. - In: JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. - ISSN 0047-2689. - 44:3(2015), p. 031208. [10.1063/1.4917488] | 2015 | MASSA, ENRICOSASSO, CARLO PAOLOMANA, GIOVANNI + | 2015_d220_AIP.pdf |
| A new 28Si single crystal: counting the atoms for the new kilogram definition / Bartl, G; Becker, P; Beckhoff, B; Bettin, H; Beyer, E; Borys, M; Busch, I; Cibik, L; D'Agostino, Giancarlo; Darlatt, E; Di Luzio, M; Fujii, K; Fujimoto, H; Fujita, K; Kolbe, M; Krumrey, M; Kuramoto, N; Massa, Enrico; Mecke, M; Mizushima, S; Müller, M; Narukawa, T; Nicolaus, A; Pramann, A; Rauch, D; Rienitz, O; Sasso, C. P; Stopic, A; Stosch, R; Waseda, A; Wundrack, S; Zhang, L; Zhang, X. W.. - In: METROLOGIA. - ISSN 0026-1394. - 54:5(2017), pp. 693-715. [10.1088/1681-7575/aa7820] | 2017 | D'AGOSTINO, GIANCARLODi Luzio, MMASSA, ENRICOSasso, C. P + | 2017 bartl avogadro.pdf |
| A new analysis for diffraction correction in optical interferometry / Mana, G; Massa, E; Sasso, C. P; Andreas, B; Kuetgens, U.. - In: METROLOGIA. - ISSN 0026-1394. - 54:4(2017), pp. 559-565. [10.1088/1681-7575/aa76af] | 2017 | Mana, GMassa, ESasso, C. P + | 2017 Metrologia diffraction correction.pdf |
| A new scanning x-ray interferometer / A., Bergamin; G., Cavagnero; Mana, Giovanni; Massa, Enrico; G., Zosi. - (2000), pp. 109-110. (Intervento presentato al convegno CPEM tenutosi a Sydney Australia nel 14-19 May). | 2000 | MANA, GIOVANNIMASSA, ENRICO + | - |
| A two thickness interferometer for lattice strain investigations / Massa, Enrico; Melis, Claudio; Sasso, Carlo Paolo; Kuetgens, Ulrich; Mana, Giovanni. - (2016), pp. 1-2. (Intervento presentato al convegno 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)) [10.1109/CPEM.2016.7540796]. | 2016 | Massa, EnricoSasso, Carlo PaoloMana, Giovanni + | 07540796.pdf |
| A two-axis tip-tilt platform for x-ray interferometry / Bergamin, A; Cavagnero, G; Durando, Giovanni; Mana, Giovanni; Massa, Enrico. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 14:6(2003), pp. 717-723. [10.1088/0957-0233/14/6/303] | 2003 | DURANDO, GIOVANNIMANA, GIOVANNIMASSA, ENRICO + | - |
| Aberration effects in two-beam laser interferometers / Cavagnero, Giovanni; Mana, Giovanni; Massa, Enrico. - In: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION. - ISSN 1084-7529. - 23:8(2006), pp. 1951-1959. [10.1364/JOSAA.23.001951] | 2006 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Accuracy of laser beam center and width calculations / Mana, Giovanni; Massa, Enrico; Rovera, A.. - In: APPLIED OPTICS. - ISSN 0003-6935. - 40:9(2001), pp. 1378-1385. [10.1364/AO.40.001378] | 2001 | MANA, GIOVANNIMASSA, ENRICO + | - |
| Accuracy of Temperature Measurements of the Avogadro-Project / Massa, Enrico; Mai, Torsten; Kuramoto, Naoki; Nicolaus, Arnold; Friedrich, Kathrin; Sasso, Carlo Paolo; Eppers, Daniela; Fujii, Kenichi. - (2018), pp. 1-2. (Intervento presentato al convegno 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) tenutosi a Paris (France) nel 8-13 July 2018) [10.1109/CPEM.2018.8501059]. | 2018 | Massa, EnricoSasso, Carlo Paolo + | - |
| Accurate measurements of the Avogadro and Planck constants by counting silicon atoms / Bettin, H; Fujii, K; Man, J; Mana, Giovanni; Massa, Enrico; Picard, A.. - In: ANNALEN DER PHYSIK. - ISSN 0003-3804. - 525:8-9(2013), pp. 680-687. [10.1002/andp.201300038] | 2013 | MANA, GIOVANNIMASSA, ENRICO + | - |
| ADVANCES IN THE MEASUREMENT OF THE 28Si LATTICE PARAMETER / Massa, Enrico; Mana, Giovanni; Kessler, E. G.. - (2010), pp. 133-134. (Intervento presentato al convegno CPEM 2010 tenutosi a Daejeon, Korea nel June 13-18, 2010). | 2010 | MASSA, ENRICOMANA, GIOVANNI + | - |
| An automated resistor network to inspect the linearity of resistance-thermometry measurements / Massa, Enrico; Mana, Giovanni. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 24:10(2013). [10.1088/0957-0233/24/10/107001] | 2013 | MASSA, ENRICOMANA, GIOVANNI | - |
| Assessment of the accuracy of the 28Si (220) plane spacing / Mana, G.; Massa, E.; Sasso, C.. - (2014), pp. 396-397. (Intervento presentato al convegno 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)) [10.1109/CPEM.2014.6898426]. | 2014 | Mana, G.Massa, E.Sasso, C. | 06898426.pdf |
| Avogadro and Planck Constants, Two Pillars of the International System of Units / Massa, Enrico. - In: PHYSICS. - ISSN 2624-8174. - 6:2(2024), pp. 845-858. [10.3390/physics6020052] | 2024 | Massa, Enrico | - |
| Avogadro constant measurements using enriched 28Si monocrystals / Fujii, K; Massa, E; Bettin, H; Kuramoto, N; Mana, G. - In: METROLOGIA. - ISSN 0026-1394. - 55:1(2018), pp. L1-L4. [10.1088/1681-7575/aa9abd] | 2018 | Massa, EMana, G + | Fujii_2018_Metrologia_55_L1.pdf |
| Avogadro, Planck and the kilogram redefinition / Massa, Enrico. - 206:(2021), pp. 47-60. [10.3254/ENFI206] | 2021 | Massa Enrico | Varenna_2019.pdf |
| Bayesian model selection applied to linear regressions with weighted data / Mana, Giovanni; Massa, Enrico; Sasso, Carlo Paolo. - In: METROLOGIA. - ISSN 0026-1394. - 56:2(2019). [10.1088/1681-7575/ab0338] | 2019 | Mana, GiovanniMassa, EnricoSasso, Carlo Paolo | 2019_Bayesian model selection.pdf; 2019_Bayesian_model_revised.pdf |
| Calibration of a silicon crystal for absolute nuclear spectroscopy / Massa, Enrico; Mana, Giovanni; Kuetgens, U; Ferroglio, L.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - 43:(2010), pp. 293-296. | 2010 | MASSA, ENRICOMANA, GIOVANNI + | - |