The critical temperature (Tc) of superconducting Ti/Au bilayer films is crucial for the performance of transition-edge sensors.We use a co-sputtering technique to insert a Ti-Au mixture layer as an artificial diffusion layer between a superconducting Ti film and a normal Au bilayer. The Ti-Au mixture layers have different thicknesses and component ratios. The cross-section and element information of thin films was characterized by a high resolution transmission electronmicroscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). The variation of Tc is measured for a series of Ti/Ti-Au/Au films. Tc is related to both the thickness and Ti-Au ratio in the mixture layer.We attempt to model the Tc variation based on the Usadel theory with an equivalent thickness ratio.
Investigation of Superconducting Ti/Ti-Au/Au Tri-Layer Films With a Co-Sputtering Process for Transition-Edge Sensors / Xu, X.; Sun, X.; He, J.; Chen, J.; Li, J.; Rajteri, M.; Garrone, H.; Pepe, C.; Gao, H.; Li, X.; Ouyang, Y.; Wang, X.. - In: IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY. - ISSN 1051-8223. - 33:5(2023), pp. -5. [10.1109/TASC.2023.3263133]
Investigation of Superconducting Ti/Ti-Au/Au Tri-Layer Films With a Co-Sputtering Process for Transition-Edge Sensors
Rajteri, M.;Garrone, H.;Pepe, C.;
2023
Abstract
The critical temperature (Tc) of superconducting Ti/Au bilayer films is crucial for the performance of transition-edge sensors.We use a co-sputtering technique to insert a Ti-Au mixture layer as an artificial diffusion layer between a superconducting Ti film and a normal Au bilayer. The Ti-Au mixture layers have different thicknesses and component ratios. The cross-section and element information of thin films was characterized by a high resolution transmission electronmicroscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). The variation of Tc is measured for a series of Ti/Ti-Au/Au films. Tc is related to both the thickness and Ti-Au ratio in the mixture layer.We attempt to model the Tc variation based on the Usadel theory with an equivalent thickness ratio.File | Dimensione | Formato | |
---|---|---|---|
2023 IEEETAS Xu Investigation_of_Superconducting_Ti_Ti-Au_Au_Tri-Layer_Films_With_a_Co-Sputtering_Process_for_TES.pdf
non disponibili
Tipologia:
final published article (publisher’s version)
Licenza:
Non Pubblico - Accesso privato/ristretto
Dimensione
1.12 MB
Formato
Adobe PDF
|
1.12 MB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Xu et al. - 2023 - Investigation of Superconducting.pdf
accesso aperto
Tipologia:
accepted manuscript (author’s post-print)
Licenza:
Pubblico - Tutti i diritti riservati
Dimensione
904.39 kB
Formato
Adobe PDF
|
904.39 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.