The critical temperature (Tc) of superconducting Ti/Au bilayer films is crucial for the performance of transition-edge sensors.We use a co-sputtering technique to insert a Ti-Au mixture layer as an artificial diffusion layer between a superconducting Ti film and a normal Au bilayer. The Ti-Au mixture layers have different thicknesses and component ratios. The cross-section and element information of thin films was characterized by a high resolution transmission electronmicroscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). The variation of Tc is measured for a series of Ti/Ti-Au/Au films. Tc is related to both the thickness and Ti-Au ratio in the mixture layer.We attempt to model the Tc variation based on the Usadel theory with an equivalent thickness ratio.

Investigation of Superconducting Ti/Ti-Au/Au Tri-Layer Films With a Co-Sputtering Process for Transition-Edge Sensors / Xu, X.; Sun, X.; He, J.; Chen, J.; Li, J.; Rajteri, M.; Garrone, H.; Pepe, C.; Gao, H.; Li, X.; Ouyang, Y.; Wang, X.. - In: IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY. - ISSN 1051-8223. - 33:5(2023), pp. -5. [10.1109/TASC.2023.3263133]

Investigation of Superconducting Ti/Ti-Au/Au Tri-Layer Films With a Co-Sputtering Process for Transition-Edge Sensors

Rajteri, M.;Garrone, H.;Pepe, C.;
2023

Abstract

The critical temperature (Tc) of superconducting Ti/Au bilayer films is crucial for the performance of transition-edge sensors.We use a co-sputtering technique to insert a Ti-Au mixture layer as an artificial diffusion layer between a superconducting Ti film and a normal Au bilayer. The Ti-Au mixture layers have different thicknesses and component ratios. The cross-section and element information of thin films was characterized by a high resolution transmission electronmicroscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). The variation of Tc is measured for a series of Ti/Ti-Au/Au films. Tc is related to both the thickness and Ti-Au ratio in the mixture layer.We attempt to model the Tc variation based on the Usadel theory with an equivalent thickness ratio.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/80379
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