The voltage and current offsets of two typical precision operational amplifiers (OPAs) with BJT and FET input, respectively, were continuously measured for two years. The paper presents the experiment, explains the method of data analysis, and discusses the results. The long-term stability turns out to be limited mainly by random walk processes.

Long-Term Behavior of Operational Amplifiers / Rubiola, Enrico; Francese, Claudio; de Marchi, Andrea. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 50:1(2001), pp. 89-94. [10.1109/19.903883]

Long-Term Behavior of Operational Amplifiers

Enrico Rubiola
;
Claudio Francese;
2001

Abstract

The voltage and current offsets of two typical precision operational amplifiers (OPAs) with BJT and FET input, respectively, were continuously measured for two years. The paper presents the experiment, explains the method of data analysis, and discusses the results. The long-term stability turns out to be limited mainly by random walk processes.
File in questo prodotto:
File Dimensione Formato  
Long-term_behavior_of_operational_amplifiers.pdf

non disponibili

Tipologia: final published article (publisher’s version)
Licenza: Non Pubblico - Accesso privato/ristretto
Dimensione 105.79 kB
Formato Adobe PDF
105.79 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/75187
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 9
  • ???jsp.display-item.citation.isi??? 8
social impact