CCM.G-K2 key comparison

Francis, O.; Baumann, H.; Ullrich, C.; Castelein, S.; Van Camp, M.; Andrade de Sousa, M.; Lima Melhorato, R.; Li, C.; Xu, J.; Su, D.; Wu, S.; Hu, H.; Wu, K.; Li, G.; Li, Z.; Hsieh, W.; Pálinkás, V.; Kostelecký, J.; Mäkinen, J.; Näränen, J.; Merlet, S.; Pereira Dos Santos, F.; Gillot, P.; Hinderer, J.; Bernard, J. D.; Le Moigne, N.; Fores, B.; Gitlein, O.; Schilling, M.; Falk, R.; Wilmes, H.; Germak, ALESSANDRO FRANCO LIDIA; Biolcati, E.; Origlia, C.; Iacovone, D.; Baccaro, F.; Mizushima, S.; De Plaen, R.; Klein, G.; Seil, M.; Radinovic, R.; Sekowski, M.; Dykowski, P.; Choi, I. M.; Kim, M. S.; Borreguero, A.; Sainz Maza, S.; Calvo, M.; Engfeldt, A.; Agren, J.; Reudink, R.; Eckl, M.; van Westrum, D.; Billson, R.; Ellis, B.

doi:10.1088/0026-1394/52/1A/07009

In November 2013 an International Key Comparison, CCM.G-K2, was organized in the Underground Laboratory for Geodynamics in Walferdange. The comparison has assembled 25 participants coming from 19 countries and four different continents. The comparison was divided into two parts: the key comparison that included 10 NMIs or DIs, and the pilot study including all participants. The global result given by the pilot study confirms that all instruments are absolutely coherent to each other. The results obtained for the key comparison confirm a good agreement between the NMI instruments

CCM.G-K2 key comparison / Francis, O.; Baumann, H.; Ullrich, C.; Castelein, S.; Van Camp, M.; Andrade de Sousa, M.; Lima Melhorato, R.; Li, C.; Xu, J.; Su, D.; Wu, S.; Hu, H.; Wu, K.; Li, G.; Li, Z.; Hsieh, W.; Pálinkás, V.; Kostelecký, J.; Mäkinen, J.; Näränen, J.; Merlet, S.; Pereira Dos Santos, F.; Gillot, P.; Hinderer, J.; Bernard, J. D.; Le Moigne, N.; Fores, B.; Gitlein, O.; Schilling, M.; Falk, R.; Wilmes, H.; Germak, ALESSANDRO FRANCO LIDIA; Biolcati, E.; Origlia, C.; Iacovone, D.; Baccaro, F.; Mizushima, S.; De Plaen, R.; Klein, G.; Seil, M.; Radinovic, R.; Sekowski, M.; Dykowski, P.; Choi, I. M.; Kim, M. S.; Borreguero, A.; Sainz Maza, S.; Calvo, M.; Engfeldt, A.; Agren, J.; Reudink, R.; Eckl, M.; van Westrum, D.; Billson, R.; Ellis, B.. - In: METROLOGIA. - ISSN 1681-7575. - 52:Issue 1A (Technical Supplement 2015)(2015). [10.1088/0026-1394/52/1A/07009]