In order to achieve the strictest tolerances required in the manufacturing of an x-ray interferometer of the triple Laue type (LLL) to be used in the accurate determination of the silicon lattice parameter, a new shape of the analyzer crystal is considered. The simulation of its behavior proves that, if specified elastic and thermal load upper limits are satisfied, the lattice plane deformations are compatible with a measurement uncertainty of a few parts in 10(9). (C) 2000 American Institute of Physics. [S0034-6748(00)02004-9].
Simulation of the thermoelastic behavior of an LLL x-ray interferometer / Bergamin, A; Cavagnero, G; Mana, Giovanni; Massa, Enrico; Zosi, G.. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 71:4(2000), pp. 1716-1722. [10.1063/1.1150526]
Simulation of the thermoelastic behavior of an LLL x-ray interferometer
MANA, GIOVANNI;MASSA, ENRICO;
2000
Abstract
In order to achieve the strictest tolerances required in the manufacturing of an x-ray interferometer of the triple Laue type (LLL) to be used in the accurate determination of the silicon lattice parameter, a new shape of the analyzer crystal is considered. The simulation of its behavior proves that, if specified elastic and thermal load upper limits are satisfied, the lattice plane deformations are compatible with a measurement uncertainty of a few parts in 10(9). (C) 2000 American Institute of Physics. [S0034-6748(00)02004-9].I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
