A novel paradigm of coordinate measurement is presented, named InPlanT. The target application is the industrial measurement of large workpieces in harsh conditions, e.g. in aerospace industry. Like other techniques, a large measuring volume is covered by laser light with no contact. Unlike most other techniques, InPlanT relies on light only to point to a target, while the actual measurement is done by standard position sensors, such as linear encoders or interferometers. The actual coordinate measurement is relegated to the border of the measuring volume, possibly protected against a harsh environment. The principle, and the characteristics and expected errors of the main InPlanT subsystems, are described. The preliminary experimental results of the most critical subsystem – responsible to detect the target – are promising.

Cartesian approach to large scale co-ordinate measurement: InPlanT / Pisani, Marco; Balsamo, Alessandro; Francese, C.. - (2014). (Intervento presentato al convegno 11th IMEKO Symposium LMPMI2014 (Laser Metrology for Precision Measurement and Inspection in Industry) tenutosi a Tsukuba (JP) nel 2014‑09‑02/05).

Cartesian approach to large scale co-ordinate measurement: InPlanT

PISANI, MARCO;BALSAMO, ALESSANDRO;Francese C.
2014

Abstract

A novel paradigm of coordinate measurement is presented, named InPlanT. The target application is the industrial measurement of large workpieces in harsh conditions, e.g. in aerospace industry. Like other techniques, a large measuring volume is covered by laser light with no contact. Unlike most other techniques, InPlanT relies on light only to point to a target, while the actual measurement is done by standard position sensors, such as linear encoders or interferometers. The actual coordinate measurement is relegated to the border of the measuring volume, possibly protected against a harsh environment. The principle, and the characteristics and expected errors of the main InPlanT subsystems, are described. The preliminary experimental results of the most critical subsystem – responsible to detect the target – are promising.
2014
11th IMEKO Symposium LMPMI2014 (Laser Metrology for Precision Measurement and Inspection in Industry)
2014‑09‑02/05
Tsukuba (JP)
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/32259
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