Investigation of Verification Artifacts in WR-03 Waveguides

This paper presents an investigation of verification artifacts in WR- 03 waveguides. The waveguide verification artifacts include a cross-guide and a custom-made circular iris section. The investigation involves the transmission loss uncertainty analysis of the verification artifacts for vector network analyzer (VNA) waveguide systems operating at millimeter wavelengths. The measurement errors due to the dimensional tolerances and the flange misalignment are predicted by using a commercially available electromagnetic software package. The data analysis is carried out for complex-valued scattering parameters (S-parameters). The uncertainty due to different error sources is computed according to the Law of Propagation of Uncertainty. The real and imaginary data along with the associated uncertainties are converted to magnitude and phase representation via linear propagation of uncertainties. The experimental results are also compared with simulated results.