A method for determining local position of an optical element associated with an optical path for transporting a laser beam in a working head of a machine for laser processing a material, includes generating a measurement beam of low coherence optical radiation traveling a measurement optical path, leading the measurement beam towards the optical element and the reflected or diffused measurement beam towards an optical interferometric sensor arrangement, generating a reference beam of low coherence optical radiation traveling a reference optical path and leading the reference beam towards the interferometric optical sensor arrangement, superimposing the measurement and reference beams on a common region of incidence, detecting a position of a pattern of interference fringes between the measurement and reference beams, and determining a difference in optical length between the measurement and reference optical paths as a function of the position of the interference pattern along an illumination axis, or of the frequency of the interference pattern in the frequency domain.

Method and system for determining the local position of at least one optical element in a machine for laser processing of a material, using low-coherence optical interferometry techniques / Donadello, Simone; Previtali, Barbara; Colombo, Daniele. - (2019).

Method and system for determining the local position of at least one optical element in a machine for laser processing of a material, using low-coherence optical interferometry techniques

Donadello, Simone;
2019

Abstract

A method for determining local position of an optical element associated with an optical path for transporting a laser beam in a working head of a machine for laser processing a material, includes generating a measurement beam of low coherence optical radiation traveling a measurement optical path, leading the measurement beam towards the optical element and the reflected or diffused measurement beam towards an optical interferometric sensor arrangement, generating a reference beam of low coherence optical radiation traveling a reference optical path and leading the reference beam towards the interferometric optical sensor arrangement, superimposing the measurement and reference beams on a common region of incidence, detecting a position of a pattern of interference fringes between the measurement and reference beams, and determining a difference in optical length between the measurement and reference optical paths as a function of the position of the interference pattern along an illumination axis, or of the frequency of the interference pattern in the frequency domain.
2019
US12214441B2
File in questo prodotto:
File Dimensione Formato  
Donadello_US12214441B2.pdf

accesso aperto

Tipologia: other attached document
Licenza: Pubblico - Tutti i diritti riservati
Dimensione 2.01 MB
Formato Adobe PDF
2.01 MB Adobe PDF Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11696/73524
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact